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In-circuit Test

click to collapse this panelDescription

In-circuit Test for the Widest Variety of Production Needs

The Agilent Medalist In-Circuit Test (ICT) family provides industry-leading solutions to help manufacturers solve PCBA test challenges brought on by shrinking packages, increasing board complexity, limited test access and price pressures.

The family features a scalable architecture in one-, two- and four-module configurations. Compatible design and innovations such as Agilent's award-winning Medalist iVTEP vectorless test and bead probe technologies provide unsurpassed coverage, test transportability, stability and repeatability.

Read more about the benefits of Agilent’s ICT products.

To learn more, request additional information product information.

Products

Medalist i1000

Medalist i3070

Agilent Vectorless Test Solution – VTEP v2.0

Agilent Medalist Bead Probe Technology

Agilent In-Circuit Test Legacy Solutions

click to collapse this panelMore Information

  • Medalist i1000
    The Agilent Medalist i1000 in-circuit test (ICT) system is a low-cost in-circuit test solution for original design manufacturers who need “just-enough tests”.
  • Medalist i3070
    The Medalist i3070, the next generation In-Circuit Test System, enables 20% more output with unparalleled test coverage and robustness, extending the performance of the world’s most proven ICT System.
  • Channel Partners and Solution Providers for In-circuit Test
    Agilent’s World-wide Channel Partner Program: View a list of system integrators, consultants, and test system providers experienced with Agilent instrumentation and products.