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- 고속 디지털 (12)
- 디스플레이포트 (1)
- HDMI (1)
- MHL 설계 및 테스트 (1)
- PCI Express 설계 및 테스트 (1)
- 직렬 ATA (SATA) (5)
- SAS(Serial Attached SCSI) (1)
- USB (2.0/3.0/무선) (2)
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제품 카테고리별
1-21 / 21
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고대역폭 액티브 오실로스코프 프로브의 유용성과 성능 비교 이해(AN 1419-02)
프로브 로딩을 최소화하고 최고 성능의 신호 구현을 위한 방법을 이해합니다.
어플리케이션 노트 2002-11-01 |
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6 Hints for Better SATA and SAS Measurements
These 6 Hints for better SATA and SAS measurements cover Tx, Rx, Impedance and Return Loss, and Host/Device Digital testing challenges.
어플리케이션 노트 2012-02-02 |
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Agilent Method of Implementation (MOI) for DisplayPort Cable-Connector Assembly Compliance Test
Agilent Method of Implementation (MOI) for DisplayPort Cable-Connector Assembly Compliance Test Using Agilent E5071C ENA Network Analyzer Option TDR
어플리케이션 노트 2013-02-18 |
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Agilent Method of Implementation (MOI) for MHL Cables Compliance Tests
Agilent Method of Implementation (MOI) for MHL Cable Compliance Tests Using Agilent E5071C ENA Network Analyzer Option TDR
어플리케이션 노트 2013-02-14 |
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Agilent Method of Implementation (MOI) for MIPI D-PHY Conformance Tests
Agilent Method of Implementation (MOI) for MIPI D-PHY Conformance Tests Using Agilent E5071C ENA Network Analyzer Option TDR
어플리케이션 노트 2011-12-01 |
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Agilent Method of Implementation (MOI) for MIPI M-PHY Conformance Tests
Agilent Method of Implementation (MOI) for MIPI M-PHY Conformance Tests Using Agilent E5071C ENA Network Analyzer Option TDR
어플리케이션 노트 2011-12-01 |
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Agilent Method of Implementation (MOI) for PCI Express 3.0 PCB Differential Trace Impedance Test
Agilent Method of Implementation (MOI) for PCI Express 3.0 PCB Differential Trace Impedance Test Using Agilent E5071C ENA Network Analyzer Option TDR
어플리케이션 노트 2012-10-16 |
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Agilent Method of Implementation (MOI) for SATA RXTX Compliance Test
Agilent Method of Implementation (MOI) for SATA RXTX Compliance Test Using Agilent E5071C ENA Network Analyzer Option TDR
어플리케이션 노트 2011-01-12 |
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Agilent Method of Implementation (MOI) for SATA SI Compliance Test
Agilent Method of Implementation (MOI) for SATA SI Compliance Test Using Agilent E5071C ENA Network Analyzer Option TDR
어플리케이션 노트 2011-01-12 |
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Agilent Method of Implementation (MOI) for USB3.0 Cable-Connector Assembly Compliance Test
Agilent Method of Implementation (MOI) for USB3.0 Cable-Connector Assembly Compliance Test Using Agilent E5071C ENA Network Analyzer Option TDR
어플리케이션 노트 2012-12-17 |
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Characterization of Balanced Digital Components and Communication Paths
어플리케이션 노트 2001-11-19 |
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Designing High Speed Backplanes Utilizing Physical Layer Test System
This Application Note focuses on the problems introduced into the backplane assembly design by the many linear passive components that create reflections due to impedance discontinuities.
어플리케이션 노트 2006-01-18 |
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Effective Reflection Characterization for Active Devices Using ENA Option TDR Application Note
This application note describes Hot TDR measurement, which is an effective characterization method for the reflection of transmitter and receiver.
어플리케이션 노트 2012-01-12 |
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Limitations and Accuracies of Time and Frequency Domain Analysis of Physical Layer Devices
어플리케이션 노트 2005-11-01 |
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Measurement Uncertainty of VNA based TDR/TDT Measurement Application Note
This application note explains the theory of measurement uncertainty in TDR/TDT measurement with the ENA Option TDR.
어플리케이션 노트 2011-07-08 |
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Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test
Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test Using Agilent E5071C ENA Network Analyzer Option TDR.
어플리케이션 노트 2013-04-24 |
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Network Analysis - De-embedding and Embedding S-Parameter Networks (1364-1)
At RF and microwave frequencies, it becomes difficult to directly measure devices with nonstandard connectors (for example, devices using surface-mount packaging).
어플리케이션 노트 2004-06-01 |
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S-Parameter Techniques for Faster, More Accurate Network Design (AN 95-1)
This Application Note is for information only. Agilent no longer sells or supports these products.
어플리케이션 노트 1967-02-01 |
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Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, & 2-Port TDR
This Application Note focuses on part 1: those which use a single-port TDR, those which use TDR/TDT, and those which use 2-port TDR.
어플리케이션 노트 2007-01-01 |
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Signal Integrity Analysis Series Part 2: 4-Port TDR/VNA/PLTS
This Application Note focuses on part 2: those which use a 4-port TDR/VNA/PLTS.
어플리케이션 노트 2007-02-21 |
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Signal Integrity Analysis Series Part 3: The ABCs of De-Embedding
This Application Note focuses on Part 3: The ABCs of De-Embedding explaining different de-embedding techniques & shows how to minimize fixture effects for best results.
어플리케이션 노트 2007-07-01 |
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