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Digital Design & Interconnect Standards

Achieve your best design with Agilent. Investigate specific solutions for high speed standards plus solutions for your high-speed digital design cycle (design, simulation, analysis, debug compliance and signal integrity) challenges.

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6 Hints for Better SATA and SAS Measurements 
These 6 Hints for better SATA and SAS measurements cover Tx, Rx, Impedance and Return Loss, and Host/Device Digital testing challenges.

Application Note 2012-02-02

PDF PDF 1.59 MB
Agilent Method of Implementation (MOI) for DisplayPort Cable-Connector Assembly Compliance Test 
Agilent Method of Implementation (MOI) for DisplayPort Cable-Connector Assembly Compliance Test Using Agilent E5071C ENA Network Analyzer Option TDR

Application Note 2013-02-18

PDF PDF 1.29 MB
Agilent Method of Implementation (MOI) for MHL Cables Compliance Tests 
Agilent Method of Implementation (MOI) for MHL Cable Compliance Tests Using Agilent E5071C ENA Network Analyzer Option TDR

Application Note 2013-02-14

PDF PDF 1.76 MB
Languages 
Agilent Method of Implementation (MOI) for MIPI D-PHY Conformance Tests 
Agilent Method of Implementation (MOI) for MIPI D-PHY Conformance Tests Using Agilent E5071C ENA Network Analyzer Option TDR

Application Note 2011-12-01

PDF PDF 920 KB
Agilent Method of Implementation (MOI) for MIPI M-PHY Conformance Tests 
Agilent Method of Implementation (MOI) for MIPI M-PHY Conformance Tests Using Agilent E5071C ENA Network Analyzer Option TDR

Application Note 2011-12-01

PDF PDF 918 KB
Agilent Method of Implementation (MOI) for PCI Express 3.0 PCB Differential Trace Impedance Test 
Agilent Method of Implementation (MOI) for PCI Express 3.0 PCB Differential Trace Impedance Test Using Agilent E5071C ENA Network Analyzer Option TDR

Application Note 2012-10-16

PDF PDF 1.62 MB
Agilent Method of Implementation (MOI) for SATA RXTX Compliance Test 
Agilent Method of Implementation (MOI) for SATA RXTX Compliance Test Using Agilent E5071C ENA Network Analyzer Option TDR

Application Note 2011-01-12

PDF PDF 1.19 MB
Agilent Method of Implementation (MOI) for SATA SI Compliance Test 
Agilent Method of Implementation (MOI) for SATA SI Compliance Test Using Agilent E5071C ENA Network Analyzer Option TDR

Application Note 2011-01-12

PDF PDF 1.41 MB
Agilent Method of Implementation (MOI) for USB3.0 Cable-Connector Assembly Compliance Test 
Agilent Method of Implementation (MOI) for USB3.0 Cable-Connector Assembly Compliance Test Using Agilent E5071C ENA Network Analyzer Option TDR

Application Note 2012-12-17

PDF PDF 1.82 MB
Characterization of Balanced Digital Components and Communication Paths 

Application Note 2001-11-19

PDF PDF 1.01 MB
Designing High Speed Backplanes Utilizing Physical Layer Test System 
This Application Note focuses on the problems introduced into the backplane assembly design by the many linear passive components that create reflections due to impedance discontinuities.

Application Note 2006-01-18

PDF PDF 1.24 MB
Languages 
Effective Reflection Characterization for Active Devices Using ENA Option TDR Application Note 
This application note describes Hot TDR measurement, which is an effective characterization method for the reflection of transmitter and receiver.

Application Note 2012-01-12

PDF PDF 416 KB
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Improving Usability and Performance in High-Bandwidth Active Oscilloscope Probes (AN 1419-02) 
Understand how to get minimal probe loading and highest-possible-performance representation of your signal.

Application Note 2002-11-01

PDF PDF 912 KB
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Limitations and Accuracies of Time and Frequency Domain Analysis of Physical Layer Devices 

Application Note 2005-11-01

PDF PDF 2.83 MB
Languages 
Measurement Uncertainty of VNA based TDR/TDT Measurement Application Note 
This application note explains the theory of measurement uncertainty in TDR/TDT measurement with the ENA Option TDR.

Application Note 2011-07-08

PDF PDF 1.77 MB
Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test 
Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test Using Agilent E5071C ENA Network Analyzer Option TDR.

Application Note 2013-04-24

PDF PDF 2.02 MB
Network Analysis - De-embedding and Embedding S-Parameter Networks (1364-1) 
At RF and microwave frequencies, it becomes difficult to directly measure devices with nonstandard connectors (for example, devices using surface-mount packaging).

Application Note 2004-06-01

PDF PDF 671 KB
Languages 
S-Parameter Techniques for Faster, More Accurate Network Design (AN 95-1) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1967-02-01

PDF PDF 3.10 MB
Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, & 2-Port TDR 
This Application Note focuses on part 1: those which use a single-port TDR, those which use TDR/TDT, and those which use 2-port TDR.

Application Note 2007-01-01

PDF PDF 3.50 MB
Signal Integrity Analysis Series Part 2: 4-Port TDR/VNA/PLTS 
This Application Note focuses on part 2: those which use a 4-port TDR/VNA/PLTS.

Application Note 2007-02-21

PDF PDF 2.75 MB
Signal Integrity Analysis Series Part 3: The ABCs of De-Embedding 
This Application Note focuses on Part 3: The ABCs of De-Embedding explaining different de-embedding techniques & shows how to minimize fixture effects for best results.

Application Note 2007-07-01

PDF PDF 2.44 MB