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Mobile Computing Application Solutions- MIPI

The Mobile Industry Processor Interface (MIPI) Alliance has defined standard interfaces for mobile terminals. As a contributor member of the MIPI Alliance and a world leader in test and measurement, Agilent is at the forefront in providing you with digital and RF test solutions for the MIPI test interfaces.

MIPI interfaces

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Agilent DigRF v3 Products & Solutions 

Press Materials 2008-03-03

 
Agilent Introduces First-to-Market Functional Test Solution for MIPI D-PHY Standard Interconnects 

Press Materials 2011-10-04

 
Agilent Introduces Industry's First Digital Radio Frequency V4 Test Solution with Simultaneous Stimu 
Agilent Technologies Inc. (NYSE: A) today announced the industry's first digital radio frequency (DigRF) V4 test solution with dual-capture capability.

Press Materials 2011-03-02

 
Agilent Launches Industry's First Complete MIPI M-PHY Test Suite  

Press Materials 2011-10-04

 
Agilent Technologies Announces Industry's First MIPI M-PHY Transmitter Compliance Test Software  
Agilent today announced the industry's first MIPI M-PHY compliance test software package for transmitter validation.

Press Materials 2011-09-28

 
Agilent Technologies Expands Infiniium 9000 Series Lineup with 600-MHz Oscilloscopes 
First Mixed-Signal Scope Supporting MIPI and SATA Applications

Press Materials 2009-10-01

 
Agilent Technologies Introduces 6-GHz Signal Generators with Industry-Best Performance 
Today's aerospace/defense environment requires enhanced radar performance to detect weak signals at long distances. To provide the pure and precise signals needed to test these designs, the MXG uses an innovative triple-loop synthesizer to deliver phase noise performance of -146 dBc/Hz at 1 GHz and 20 kHz offset. For developers of radar components such as mixers and analog-to-digital converters, the MXG also features industry-leading spurious performance of -96 dBc at 1 GHz.

Press Materials 2012-05-01

 
Agilent Technologies Introduces Industry-First End-to-End DigRF V4 Measurement Solution for Mobile  

Press Materials 2008-10-01

 
Agilent Technologies' All-in-One MIPI D-PHY Test Platform Selected by ST Microelectronics 

Press Materials 2011-10-04

 
Agilent Technologies' All-in-One MIPI D-PHY Test Platform Selected by ST-NXP Wireless  

Press Materials 2008-09-17

 
Deep Memory and Raw Data Views Give Unprecedented Insight into Demanding CSI-2/DSI Designs 

Press Materials 2012-06-12