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  - Agilent EEsof EDA Software
    - Advanced Design System (ADS) (6)
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1-12 of 12

Agilent EEsof EDA Customer Education and Services Brief overview of Agilent EEsof EDA Customer Education and Services. Training Materials 2010-08-11
Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro Originally broadcast Jan 27, 2011 Webcast - recorded
EMC 2013 - IEEE International Symposium on Electromagnetic Compatibility August 5- 9, 2013; Denver, CO Tradeshow
Genesys Webcasts - "How-To-Design" series Originally broadcast in 2009. Access the 6 WebEX recordings Webcast - recorded
IC-CAP User Training This 3-day course will show device modelers how to use Agilent EEsof EDA's IC-CAP software. Click on link to view full course description and class dates and locations. Classroom Training
IMS 2011 (IEEE MTT-S) – Connect, Expert to Expert, at Agilent Avenue 2011 show, last June, 2011; Baltimore Convention Center Tradeshow
Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast Original broadcast May 7, 2013 Webcast - recorded
Measurement Based FET Modeling using Artifical Neural Networks (ANN) This presentation was given by Jianjun Xu with introduction by David Root as part of the Innovations in EDA Webcast Series. Seminar Materials 2012-02-07	PDF 2.51 MB
Presentation on BSIM4, BSIM3v3 and BSIMSOI RF MOS Modeling This Presentation by Dr. Thomas Gneiting (Advanced Modeling Solution) was presented at Agilent EEsof EDA Seminar, April 04, 2001 details the structure of BSIM3v3, BSIMSOI and BSIM4 RF models. Seminar Materials 2001-04-04	PDF 1.49 MB
Presentation on DC & AC Characterization of Semiconductors This Presentation focuses on basics of device measurement and modeling techniques from DC to RF, special aspects of network analyzer calibration, de-embedding and required dummy structures. Seminar Materials 2003-01-28	PDF 893 KB
Setting Up IC-CAP WaferPro For On-Wafer Measurements originally broadcast June 22, 2011 Webcast - recorded
Setting up IC-CAP WaferPro for On-Wafer Measurements IC-CAP WaferProIs is an extremely powerful test plan suite, for on-Wafer DC/CV and RF device modeling measurements. Seminar Materials 2011-06-22	PDF 3.07 MB