Wireless Connectivity
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A full portfolio of test and design solutions from Agilent also spans the range of cellular technologies; LTE, 4G LTE, MIMO, HSPA, HSPA+, and more.
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- Application Note (104)
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51-75 of 104
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MIMO Wireless LAN PHY Layer (RF) Operation & Measurement Application Note 1509
This application note is intended to provide an understanding of MIMO radio operation as it applies to WLAN, and the test configurations for multi-channel radios.
Application Note 2008-04-30 |
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Mobile WiMAX™ PHY Layer (RF) Operation and Measurement
This application note describes the operation and physical layer measurements of 802.16e OFDMA Mobile WiMAX devices.
Application Note 2008-07-17 |
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7.84 MB
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Mobile WiMAX™ Manufacturing Test with the N8300A
This document describes how to use the N8300A wireless networking test set for WiMax manufacturing test, including an explanation of required test measurements for mobile stations.
Application Note 2008-04-11 |
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422 KB
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Multichannel Measurements in MIMO 802.11ac Baseband IQ Simulation, Design and Test - Application Not
This solution brief will show Agilent Technologies' complete, end-to-end solution for multichannel measurements of 802.11ac BBIQ simulation, design and test.
Application Note 2013-04-05 |
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748 KB
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N4010A Programming Made Easy for WLAN Applications
This application note shows WLAN test developers and application engineers how to create effective integration test plans and manufacturing test sequences for the N4010A test set.
Application Note 2007-04-17 |
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954 KB
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N4010A Wireless Connectivity Test Set Performance Guide, Application Note
This guide characterizes the performance of the N4010A wireless connectivity test set and the 89601A vector signal analysis (VSA) software combination
Application Note 2004-06-29 |
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455 KB
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N8300A: Implement a WLAN test plan using SCPI programming (Part 2)
Application Note 2009-04-27 |
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687 KB
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N8300A: Introduction to a WLAN manufacturing test plan and theory of implementation (Part 1)
Application Note 2009-04-21 |
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507 KB
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N8300A: Techniques for optimizing WLAN device testing (Part 3)
Application Note 2009-05-12 |
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483 KB
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Next-Generation WLAN Manufacturing Test Solutions
This application note begins with a brief introduction to IEEE 802.11
technologies, followed by a description of the golden radio-based test system
and its main limitations for WLAN manufacturing.
Application Note 2004-05-28 |
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Non-Contact Measurement Method for 13.56 MHz RFID Tags Using the ENA/ENA-L Network Analyzer
For engineers working in RFID antenna design and test, this note discusses a non-contact method for measuring resonant frequencies of RFIDs using a network analyzer.
Application Note 2009-02-20 |
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199 KB
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Optimizing Bluetooth Device Battery Drain Measurements in Manufacturing (AN 1396)
This application note discusses optimizing battery drain measurements in manufacturing test for Bluetooth devices.
Application Note 2002-04-03 |
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Optimizing Dynamic Range for Distortion Measurements
This Product Note covers high dynamic range measurement techniques for the new PSA Performance Spectrum Analyzer Series. The Note describes the best way to use the PSA series to make distortion measurements such as ACP, intermodulation, and harmonic distortion.
Application Note 2011-10-27 |
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Optimizing Power Savings on WiMax and Other Cellular WWAN Interface Devices
This document describes how to optimze power savings on WiMax and other cellular WWAN interface devices.
Application Note 2008-07-15 |
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658 KB
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Optimizing Speed for WiMAX Measurements
Application note describing the settings and recommendations to optimize the throughput for making Mobile WiMAX™ measurements using the MXA signal analyzer N9020A and N9075A 802.16 OFDMA measurement application.
Application Note 2007-10-01 |
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129 KB
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OTA Test Methods for Evaluating the Performance of MIMO User Equipment
This application note discusses the theory, techniques and validation of three predominant OTA test methods including the two-stage OTA, multiple test probe OTA and reverberation chamber methods.
Application Note 2010-12-17 |
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2.10 MB
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P-Series Power Meter N1911A/N1912A IEEE 802.16 WiMAX™ Measurement Application
This article covers the technical overview and features, benefits and specifications of the P-Series power meters and sensors for IEEE 802.16 WiMAX measurement applications.
Application Note 2007-03-21 |
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1.69 MB
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Power Accuracy in Receiver Test
This application note tells how power measurement inaccuracy affects receiver tests, and shows you how to use external variable attenuators to increase accuracy and speed.
Application Note 2008-07-09 |
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Preselector Tuning for Amplitude Accuracy in Microwave Spectrum Analysis
This 8 page application note introduces the technique for broadband modulated signals employed in the new MXA signal analyzer.
Application Note 2009-08-14 |
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387 KB
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PSA Performance Spectrum Analyzer Series: Amplitude Accuracy
This Product Note describes the excellent amplitude accuracy performance of the new PSA Performance Spectrum Analyzer Series.
Application Note 2006-08-31 |
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154 KB
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Receiver Minimum Input Level Sensitivity
Receiver minimum input level sensitivity is the minimum specified rf level of a WLAN signal that a WLAN receiver will receive and demodulate.
Application Note 2003-09-22 |
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RF Testing of Wireless LAN Products Application Note (AN1380-1)
This Application Note discusses the modulation technology behind several wireless LAN standards and the measurement techniques that can be used to trouble shoot and quantify their RF performance.
Application Note 2007-01-10 |
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Simplify dc current drain measurements and analysis on WLAN Network cards
Minimizing current drain is critical to the success of new WLAN Network cards. High or excessive current drain can reduce the host device battery operating time considerably.
Application Note 2008-06-04 |
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Solutions for Active Device Test
This application note, Using Modern VNAs to Automate Traditional Multi-instrument RF Test Systems, shows how test system designers can design simpler test systems with the lowest overall cost of ownership.
Application Note 2009-05-05 |
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569 KB
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Solutions for Characterizing High-Power Devices—Using X-parameters to Make Nonlinear Measurements of
This “Solutions for…” app note discusses X-parameters used to properly characterize and understand the behavior of high power amplifiers, as engineers push them to their limit, into nonlinear operation.
Application Note 2010-03-04 |
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2.68 MB
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