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Presentation on Digital Predistortion of Power Amplifiers 
This Presentation by Shawn P. Stapleton is a basic overview of the key features, technologies, and performance requirements of digital predistortion of power amplifiers.

Présentation de séminaire 2001-06-01

PDF PDF 865 KB
Presentation on Multitone Power Amplifier Design Efficiency 
This Presentation by Michal Odyniec (Agilent) introduces the use of closed-form formulae for class A and class B amplifiers, and the trade-offs they allow for average efficiency versus linearity.

Présentation de séminaire 2000-11-01

PDF PDF 233 KB
Presentation on Power Amplifier Design with Custom Templates 
This Presentation focuses on designing power amplifiers with ADS using custom templates. Templates simplify the use of ADS and are a powerful productivity tool for designing power amplifiers.

Présentation de séminaire 2000-11-01

PDF PDF 515 KB
Presentation on Regenerative Payload Downconverter Simulation 
This Presentation describes Regenerative Payload Downconverter Simulation in detail.

Présentation de séminaire 2002-05-01

PDF PDF 1.04 MB
Presentation on RF Predistortion of Power Amplifiers - Part 1 
This Presentation by Shawn P. Stapleton on RF Predistortion of Power Amplifiers focuses on adaptive RF predistrotion techniques - concepts and RF predistortion design examples.

Présentation de séminaire 2000-11-01

PDF PDF 360 KB
Presentation: Adaptive FeedForward Linearization for RF Power Amplifiers - Part 1 
This Presentation by Shawn P. Stapleton presents an overview on adaptive feedforward linearization, feedforward linearization design solutions using ADS.

Présentation de séminaire 2000-11-01

PDF PDF 429 KB
Printed Circuit Board (PCB) Test and Inspection - Archived Event and Seminar Material 

Webcast - enregistré

 
Programming Static and Dynamic Data into a I2C EEPROM and Serial Flash on the 3070 
Originally broadcast April 13, 2010; webex

Webcast - enregistré

 
Pt Mugu's 42nd Annual EW Symposium: "Collaborative Electronic Warfare" 
Jan 24 - 26, 2012

Salon professionnel

 
PXI, AXIe, DAQ and Modular Solutions Webcast Series 
Live and on-demand webcasts, various dates in 2012

Webcast

 
Reduce Test Time, Increase Fault Coverage with the new Medalist i3070 Series 5 and the 8.1 Software  
Originally broadcast July 13, 2010

Webcast - enregistré

 
RF and Microwave Education Series 
2013 Webcast Series

Webcast - enregistré

 
RF and Microwave Fundamentals 
This course provides an introductory training to refresh the RF & Microwave basic concepts and to discuss the measurement fundamentals at high frequencies.

Formation en classe

 
RF Back to Basics 2013 Seminar 
presentations from the US/Canada tour

Séminaire

 
RF Back to Basics : Part 1 – Signal Analysis Webcast 
Original broadcast Jan 25, 2012

Webcast - enregistré

 
RF Back to Basics Seminar- 2013 
Various cities in the US

Séminaire

 
RF Power Amplifier Design Series - Part 2: End-to-End Design and Simulation of Handset PA Modules 
Original broadcast Mar 1, 2012

Webcast - enregistré

 
RF Power Amplifier Design Series: Part 1 
An Agilent EEsof EDA Innovations in EDA Webcast Series slide set on using simulated and measured load pull for optimal performance.

Présentation de séminaire 2011-11-08

PDF PDF 1.78 MB
See the Future of High-Performance Real-Time Oscilloscopes 
Original broadcast Apr 11, 2012

Webcast - enregistré

 
Setting Up IC-CAP WaferPro For On-Wafer Measurements 
originally broadcast June 22, 2011

Webcast - enregistré

 
Setting up IC-CAP WaferPro for On-Wafer Measurements 
IC-CAP WaferProIs is an extremely powerful test plan suite, for on-Wafer DC/CV and RF device modeling measurements.

Présentation de séminaire 2011-06-22

PDF PDF 3.07 MB
Solar Energy – Distributed MPPT – Technology trends and testing methods - Web Seminar Recording 
In this seminar we consider the challenges that people working on micronverters and DC power optimizers are facing. After a quick overview of characteristics of solar cells and modules, we explain how to Generate I-V curves...

Webcast - enregistré

 
Spectrum Analysis Measurements One-Day Course 
This one-day course presented by Agilent Technologies, Inc. is designed to provide the theoretical fundamentals and in depth hands-on experience on practical spectrum analysis measurements. The content is focused on Agilent’s new X-Series spectrum analyzers, MXA N9020A and EXA N9010A. This course will briefly cover our high performance spectrum analyzer PSA E4440A.

Formation en classe

 
Surviving State Disruptions Caused by Test: the "Lobotomy Problem” 
Boundary scan test may affect the logic states of a device as it switches between core logic operation to test mode operation. This webcast puts forth proposals to restore the logic state to a defined state after testing.

Matériel de formation 2010-12-21

 
Surviving State Disruptions Caused by Test: the “Lobotomy Problem” 
Originally broadcast Dec 9, 2010

Webcast - enregistré

 

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