High-Speed Digital

In digital standards, every generational change puts new risks in your path. We see it firsthand when creating our products and working with engineers like you. Agilent’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of. Agilent - achieve your best design.

Navigate the entire design cycle

Explore this web site for solutions within all four stages of the design cycle as well as the crucial—and integral—field of signal integrity analysis.

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Oscilloscopes, Analyzers, Meters (38)
- Oscilloscopes (25)
- Spectrum Analyzers (Signal Analyzers) (5)
- Network Analyzers (9)
- Handheld Oscilloscopes, Analyzers, Meters (3)
- Logic Analyzers (5)
- Protocol Analyzers and Exercisers (5)
- EMI/EMC, Phase Noise, Physical Layer Test Systems (5)
- Bit Error Ratio Test (BERT) Solutions (10)
- Digital Multimeters (DMM) (2)
- Power Meters & Power Sensors (2)
- Frequency Counter Products (2)
- Noise Figure Analyzers & Noise Sources (2)
- LCR Meters & Impedance Measurement Products (5)
- Digitizers (3)
- DC Power Analyzers (2)
- Dynamic Signal Analyzers, Materials Measurement (2)
- Parameter & Device Analyzers, Curve Tracer (2)
Generators, Sources, Supplies (12)
- Signal Generators (Signal Sources) (3)
- Function / Arbitrary Waveform Generators (5)
- Pulse Generator Products (10)
- Data Generators & Analyzers (9)
- DC Power Supplies (2)
- Source Measure Units (2)
- DC Electronic Loads (2)
- AC Power Sources / Power Analyzers (2)
Software (37)
- Agilent EEsof EDA Software (26)
- Application Software for Instruments (15)
- Instrument Control Software (2)
- 89600 VSA Software (2)
- Agilent VEE (2)
- Interactive Functional Test (IFT) Software (2)
- Wireless Test Managers (2)
- EasyEXPERT software and Desktop EasyEXPERT software (2)
- Calibration & Adjustment Software (2)
- Agilent License Manager (2)
PXI, AXIe, DAQ & Modular Solutions (8)
- PXI Products & Solutions (3)
- AXIe Products & Solutions (5)
- Data Acquisition Modules - DAQ (4)
- PCI/PCIe/cPCI/VME Digitizers (2)
- USB Products & Solutions (5)
- VXI Products & Solutions (2)
Additional Test & Measurement Products (22)
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26-50 of 77

Hacking the Backplane:Complete Differential Channel Characterization & Analysis from 4-port Meas. Seminar Materials 2008-11-09
High-Sensitivity Current Measurements using an Oscilloscope Webcast Original broadcast April 17, 2013 Webcast - recorded
High-speed Oscilloscope Probing: Ensuring Maximum Performance and Signal Integrity Originally broadcast March 10, 2011 Webcast - recorded
How to Solve DDR Signal Integrity Validation Challenges How to Solve DDR Signal Integrity Validation Challenges Training Materials 2008-02-13
IMS 2011 (IEEE MTT-S) – Connect, Expert to Expert, at Agilent Avenue 2011 show, last June, 2011; Baltimore Convention Center Tradeshow
IMS 2012 (IEEE MTT-S) – Connect, Expert to Expert, at Agilent Avenue June 17-22, 2012 in Montréal, Canada Tradeshow
IMS 2013 (IEEE MTT-S) – Connect, Expert to Expert, at Agilent Avenue June 2 - 7, 2013 in Seattle, WA Tradeshow
InfiniBand Compliance and System Testing This tutorial provides an overview of Infiniband test requirements, compliance and system tests, and performance measurements. Training Materials 2002-07-26	PDF 906 KB
Innovations in EDA: Multi-Technology RF Design Using the New Advances in ADS 2011 Originally broadcast March 1, 2011 Webcast - recorded
Innovations in EDA: Opto-Electronic Signal Integrity on Optical Fiber Chip-to-Chip Link Originally broadcast April 7, 2011 Webcast - recorded
Innovations in EM Simulation for High Speed Digital Design Originally broadcast Nov 18, 2010; Part of the Series: Signal Integrity for High Speed Digital Interconnects. Webcast - recorded
Introduction to EMI/EMC Challenges and Their Solution Agilent EEsof EDA presentation on how to, "Overcome High Speed Digital Design Challenges". Seminar Materials 2012-02-16	PDF 3.46 MB
Is Simulation a Requirement for Memory Designs Webcast Live broadcast February 20, 2013; 10am Pacific / 1pm Eastern Webcast
Jitter Analysis: What Works, What Doesn't & Why eSeminar FAQs FAQs from the eSeminar Seminar Materials 2006-05-11	PDF 63 KB
Jitter in Digital Circuits eSeminar FAQs FAQs from the eSeminar Seminar Materials 2006-05-11	PDF 34 KB
Jitter Measurements for High-Speed Digital Jitter Measurements for High-Speed Digital Transmission Seminar Materials 2006-06-14	PDF 44 KB
Jitter Measurements with a High-Speed Scope eSeminar FAQs FAQs from the eSeminar Seminar Materials 2006-05-11	PDF 117 KB
Learn to Analyze, Validate and Debug High Speed DDR3 Memory Original broadcast Oct 4, 2011 Webcast - recorded
Making Your Most Accurate DDR4 Compliance Measurements Webcast Originally broadcast January 23, 2013 Webcast - recorded
Minimizing Crosstalk in Hi-Speed Interconnects using Measurement-based Modeling This Presentation presented by Mike Resso (Agilent Technologies) focuses on minimizing crosstalk in high speed interconnects using measurement-based modeling. Seminar Materials 2006-09-01	PDF 1.50 MB
Modeling Optical Fiber Communication with Channel Simulation Webcast Live broadcast March 6, 2013; 10am Pacific / 1pm Eastern Webcast - recorded
New impedance measurement solutions & apps using 5 Hz to 3 GHz VNA Originally broadcast April 19, 2011 Webcast - recorded
Optimizing PXI Modular Functional Test System Throughput Webcast Originally broadcast April 27, 2011 Webcast - recorded
Oscilloscope Techniques for Precisely Measuring Small Signals Webcast Original broadcast February 13, 2013 Webcast - recorded
Overcome High Speed Digital Design Challenges Webcast Series Series of live and on-demand webcasts Webcast - recorded

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