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Focus where it counts

Missions evolve but one thing stays the same: the need to protect those who go in harm´s way. Success depends on a changing mix of people and technology ― and as technology becomes more complex, assuring readiness gets tougher.

Agilent is a source of assurance that your mission will succeed. Through our expertise in measurement science and test processes, we give you more time for the bigger issues: fulfilling today´s mission and managing the transition to what comes next. By helping you build greater assurance in system readiness, Agilent frees you to focus where it counts most.

See Measurement Solution Examples: Active Antenna Test, Multi-Emitter Environment Test Signals

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Techniques for Time Domain Measurements - Application Note  
This application note will introduce time domain and DTF measurement techniques for identifying the location and relative amplitudes of discontinuities while operating in the field.

Application Note 2013-03-05

 
Test-System Computer I/O Considerations (AN 1465-2) - Application Note 
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing

Application Note 2004-12-09

PDF PDF 189 KB
Test-System Development Guide: Operational Maintenance (AN 1465-8) 

Application Note 2004-12-21

PDF PDF 217 KB
Languages 
Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note 
This application note answers common questions about the use of drivers and direct I/O to send commands from a PC application to the test instrument.

Application Note 2004-12-21

PDF PDF 374 KB
Testing and Troubleshooting Digital RF Communications Receiver Designs (AN 1314) 
This Application Note covers the fundamental measurement principles involved in testing and troubleshooting digital communications receivers, particularly those used in digital RF cellular systems. Measurement setups are provided for receiver performance tests and troubleshooting tips are given.

Application Note 2002-03-25

PDF PDF 284 KB
Languages 
The Real “Total Cost of Ownership” of Your Test Equipment 
This paper covers a TCO model for electronic T&M equipment and shows how operating costs can be critical drivers in reducing total cost of ownership beyond simply lowering acquisition (capital) costs.

Application Note 2010-09-30

PDF PDF 1.14 MB
Languages 
Three Reasons to Migrate From Your 8662A/8663A to the E8663D RF Signal Generator 
This application note demonstrates the advantages of the E8663D over the 8662A/8663A, giving you three compelling reasons to migrate: superior performance, enhanced usability, and modern supportability.

Application Note 2009-10-22

PDF PDF 1.33 MB
Languages 
Typical GPS Receiver Verification Tests Using a GPS Signal Simulator - Application Note  
This paper describes typical GPS receiver verification tests using a GPS signal simulator. The tests are used to verify functionality of embedded GPS receivers in mobile consumer products such as cell phones and other handheld receivers.

Application Note 2010-03-04

PDF PDF 355 KB
Languages 
Ultra-wideband Communication RF Measurements 

Application Note 2004-05-21

PDF PDF 2.97 MB
Languages 
Understanding RF/Microwave Solid State Switches and their Applications 
This note explains FET, PIN diode and hybrid solid state switches. It discusses benefits/disadvantages of each type of switch, which specifications to consider and why, and gives application examples.

Application Note 2010-05-21

PDF PDF 1.07 MB
Understanding the Effects of Racking & System Interconnections (AN 1465-6) 

Application Note 2004-12-21

PDF PDF 235 KB
Using Agilent SystemVue to Create Realistic Scenarios for Radar and EW Applications  
Shows how the combination of software and hardware capabilities makes it possible to create dynamic and realistic scenarios for both component testing and scenario simulation for system test.

Application Note 2012-01-24

PDF PDF 3.01 MB
Using EVM Measurements to Analyze and Troubleshoot Vector-Modulated Signals (PN 89400-14) 
This Product Note reviews the basics of EVM measurements on the 89400 vector signal analyzers, and outlines a general procedure that may be used to methodically track down even the most obscure signal problems. Understanding Error Vector Magnitude EVM Defined Making EVM...

Application Note 2000-10-01

PDF PDF 205 KB
Languages 
Using Extended Calibration Software for Wide Bandwidth Measurements (AN 1443) 
This 16-page application note explains how to ensure accurate measurements with a vector signal analyzer using quick calibration methods.

Application Note 2008-05-22

PDF PDF 1.19 MB
Languages 
Using LAN in Test Systems - Network Configuration (AN 1465-10) - Application Note 
The decision to use LAN in a test system delivers important benefits to your company and your team. From a business perspective, intense competition among equipment vendors has produced a wide selection of high quality, low-cost solutions for local area networking

Application Note 2004-09-14

PDF PDF 182 KB
Languages 
Using LAN in Test Systems - The Basics (AN 1465-9) - Application Note 
The basic purpose of any test system is to characterize and validate the performance of electronic components, assemblies or products. The complexity of this task depends on variables such as the physical nature of the device under test (DUT), the number of tests to be performed, the number of signals to be measured and the desired time per test.

Application Note 2004-07-29

PDF PDF 270 KB
Using LAN in Test Systems: Applications (1465-14) - Application Note and Example Programs 
Topics include balancing cost, convenience and security in three common LAN scenarios: sharing instruments, remote monitoring and data acquisition, and functional test systems. Includes downloadable example programs.

Application Note 2005-04-01

 
Using LAN in Test Systems: Setting up System I/O (AN 1465-15) - Application Note 
This set of application notes shows you how to simplify test system integration by utilizing open connectivity standards such as local area networking (LAN). The collective goal of these notes is to help you produce reliable results, meet your throughput requirements and stay within your budget.

Application Note 2005-03-29

PDF PDF 263 KB
Using Linux in Your Test Systems: Linux Basics (AN 1465-27) 
If you haven’t used Linux in test applications, this document will provide a detailed overview. Topics include: A brief Linux history, why use Linux, free tools available for application development and an instrument control overview.

Application Note 2007-05-08

PDF PDF 303 KB
Languages 
Using LXI to go beyond GPIB, PXI and VXI (AN 1465-20) 
This application note focuses on the key attributes of the LXI standard, the major challenges in system development, the ways in which LXI addresses the key challenges, and the new possibilities in testing enabled by LXI devices.

Application Note 2006-01-17

PDF PDF 308 KB
Languages 
Using MATLAB to Create Agilent Signal and Spectrum Analyzer Applications 
Learn to use MATLAB software to configure, control, and acquire data from X-Series signal and spectrum analyzers, and then use scripts to create, modify and execute custom analyzer applications.

Application Note 2009-09-03

PDF PDF 1.11 MB
Using SCPI and Direct I/O vs. Drivers (AN 1465-13) - Application Note 
Using SCPI and Direct I/O vs. Drivers, the fifth note in the series, outlines the relationship between input/output (I/O) software, application software and the ability to maximize instrument interchange and software reuse in present and future systems

Application Note 2004-12-13

PDF PDF 408 KB
Using Synthetic Instruments in Your Test System (AN 1465-24) 
This note represents a brief history of SI, compares a rack-and-stack system to an SI-based system, descibes the initial applications of SIs, and illustrates the emulation of conventional instruments with SIs.

Application Note 2006-08-28

PDF PDF 290 KB
Languages 
Using SystemVue’s Radar Library to Generate Signals for Radar Design and Verification  
Agilent's Radar Library helps you with the productivity and accuracy of your radar signals.

Application Note 2011-01-25

PDF PDF 3.20 MB
Languages 
Using USB in the Test and Measurement Environment (AN 1465-12) - Application Note 
Simplify test integration with USB interface. Whether you’re setting up an ad hoc system on a lab bench or designing a permanent solution for a manufacturing line, the three best choices today for connecting modern instrumentation to computers are GPIB, LAN, and USB.

Application Note 2004-11-19

PDF PDF 194 KB

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