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Long Term Evolution - LTE Test

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Greater insight. Greater confidence. Accelerate next-generation wireless. 

Agilent gives you “greater insight” into your Long Term Evolution (LTE) designs and LTE Test. We provide reduced design uncertainty, faster and easier development of high-performing LTE products and help you find root causes faster. Now with first-to-market test solutions for LTE-Advanced.

To learn more about LTE technology : LTE Technology Overview

To learn more about the LTE implementation of MIMO: MIMO Test

Receive App Notes, CD's and other resources : Long Term Evolution - LTE Resources

To find the product that fits your stage of Long Term Evolution (LTE) development see links to the left.

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3GPP-LTE Wireless Library Element Overview 
Overview of 3GPP-LTE Wireless Library Element

Technical Overview 2009-02-02

 
89600 WLA Technical Overview 
This application note introduces link operation, wireless link analysis, a graphical approach to WLA, dynamic measurements, and additional capabilities specific to the analysis of LTE devices.

Technical Overview 2011-10-04

Advanced Design System: The High-Frequency/High-Speed Co-Design Platform 
Technical overview of Advanced Design System as a co-design platform.

Technical Overview 2009-02-10

 
E8895 3GPP LTE Wireless Library 

Technical Overview 2007-07-23

 
LTE & LTE-Advanced FDD & TDD Modulation Analysis Technical Overview 
This technical overview describes LTE FDD and LTE TDD modulation analysis using Option BHD or BHE.

Technical Overview 2012-12-18

LTE Solutions in Network Deployment and Optimization 
Agilent’s E6474A and N9912A provide air interface troubleshooting and optimization, cell site test and interference hunting on LTE systems

Technical Overview 2009-11-13

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N7109A Multi-Channel Signal Analysis System 
The N7109A combines modular N7100 Series measurement hardware with the MIMO capabilities of the industry-leading Agilent 89600B vector signal analysis (VSA) software.

Data Sheet 2013-01-23

N9080A LTE FDD & N9082A LTE TDD X-Series Measurement Application Technical Overview 
The LTE FDD and LTE TDD measurement applications transform the X-Series signal analyzers into 3GPP LTE standard-based RF transmitter testers, with fast one-button RF conformance measurements.

Technical Overview 2012-10-17

Testing LTE TDD MIMO Systems Using ADS Connected Solutions 
This is a Technical Overview on testing LTE TDD MIMO systems using ADS Connected Solutions.

Technical Overview 2009-07-13

W1910 LTE Boasband Verification Library, W1912 LTE Baseband Exploration 
The W1910EP/ET and W1912ET LTE baseband PHY libraries save time, reduce engineering effort and accelerate the maturity of baseband PHY designs for next-generation 3GPP LTE systems.

Data Sheet 2009-07-27