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X-parameters

Agilent’s X-parameters* functionality represents a new category of nonlinear network parameters for high-frequency design. X-parameters:

  • Are applicable to both large-signal and small-signal conditions, and for linear and nonlinear components.
  • Characterize the amplitudes and relative phase of harmonics generated by components under large input power levels at all ports.
  • Correctly characterize impedance mismatches and frequency mixing behavior to allow accurate simulation of cascaded nonlinear X-parameter blocks, such as amplifiers and mixers in wireless design.
  • Functionality was included in the Nonlinear Vector Network Analyzer (NVNA), and the Advanced Design System in 2008.
  • X-parameter model support was added to the SystemVue environment in 2010. SystemVue connects X-parameter models into RF system-level analysis, as well as full physical layer baseband/DSP simulations
  • X-parameter model support was added to the Genesys RF and Microwave simulation environment for circuit and system design in 2010.

NVNA Nonlinear Measurements and ADS Simulation and Design

Agilent's X-parameters functionality can help you overcome a key challenge in RF engineering, namely that of nonlinear impedance differences, harmonic mixing, and nonlinear reflection effects that occur when components are cascaded under large signal operating conditions. X-parameters help solve this complex cascading problem: if you measure the X-parameters of a set of components individually, you can calculate the X-parameters and hence the nonlinear transfer function of any cascade made from them. Calculations based on X-parameters are usually performed within a harmonic balance simulator environment.

See Measurement Solution Example: X-Parameter Measurements

* "X-parameters" is a trademark of Agilent Technologies, Inc. The X-parameters format and underlying equations are open and documented. For more information, refer to X-parameters Open Documentation, Trademark Usage & Partnerships.

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Agilent Technologies Commits $90 Million Gift of Software to Georgia Institute of Technology 
Agilent announces the largest in-kind software donation ever in its longstanding relationship with the Georgia Institute of Technology.

보도자료 2013-02-04

 
EDN's 19th Annual Innovation Awards Finalists: Agilent's PNA-X NVNA 

기사 2012-11-30

 
Agilent Technologies Ships Newest GoldenGate Software Release for RFIC Designers 
Agilent announces shipment of its GoldenGate 2012.10 RFIC simulation, verification and analysis software.

보도자료 2012-11-16

 
최신 Power of - X 어플리케이션 노트 무료 다운로드 
혁신적인 고성능 설계를 통해 경쟁업체보다 출시 시간을 앞당겨줄 수 있는 애질런트의 테스트 제품군인 Power of X를 소개합니다.

판촉 자료 2012-09-07

 
Agilent Technologies Collaborates with Thales to Apply X-parameters* Technology to RF System Design 
Agilent announces that its ongoing collaboration with Thales, a global technology leader for the defense and security and the aerospace and transport markets, has expanded the reach of X-parameters technology to wideband super-heterodyne receiver applications.

보도자료 2012-06-20

 
Agilent to Demonstrate Its Newest RF/Microwave Design and Test Products at IMS 
Agilent will demonstrate its newest design and test products for advanced RF and microwave research, development and manufacturing at the 2012 IEEE MTT-S International Microwave Symposium (Booth 1015), June 17-22, at the Palais des congrès de Montréal.

보도자료 2012-06-04

 
Agilent Technologies' Newest GoldenGate Software Release Accelerates Design Verification 
Agilent announced the latest release of its RFIC simulation, verification and analysis software, GoldenGate 2012.

보도자료 2012-06-04

 
Agilent Announces Availability of Mitsubishi Electric's Nonlinear RF Model Library for ADS 
Agilent announces that the latest model library for Mitsubishi Electric's nonlinear GaAs and GaN RF devices is now available for use with Advanced Design System (ADS).

보도자료 2012-01-12

 
Nonlinear Vector Network Analyzer (NVNA) Brochure 
NVNA provides the critical leap in technology to go beyond linear S-parameters, allowing efficient and accurate analysis and design of active devices under real world operating conditions.

브로셔 2011-09-20

PDF PDF 1.44 MB
Aerospace/Defense Radar Test Solutions from Agilent 
This brochure describes Agilent’s commitment to, and solutions for, the Aerospace/Defense market worldwide.

브로셔 2011-06-24

PDF PDF 1.84 MB
Agilent Technologies Advances X-Parameters Innovations  
Agilent announces the latest wave of X-parameter innovations designed to further advance their use and support the industry's rapidly increasing interest in the technology.

보도자료 2011-06-08

 
Time-domain Simulations of High-speed Links with X parameters 

보도자료 2011-03-24

 
X-parameters Aid MMIC Design 
Microwaves & RF article on how models based X-parameters can provide insights into the linear and nonlinear behavior of key components in wireless systems, including power amplifiers and mixers.

저널 2010-07-30

 
A Simplified Extension of X-parameters to Describe Memory Effects for Wideband Modulated Signals 
Model memory effects of microwave amplifiers in the case of wideband modulated signals.

어플리케이션 노트 2010-05-05

PDF PDF 616 Bytes
Microwave Journal Cover Article: X-parameters Fundamentally Changing Nonlinear Microwave Design 
Provides an overview of the invention and need for x-parameters to model the behavior of non-linear devices. This is an article reprint from Microwave Journal, Issue March 2010, Vol.53. No.3

기사 2010-03-25

PDF PDF 771 KB
X-Parameters: Commercial Implementations for the Latest Technology Enable Mainstream Applications 
This article reprint from Microwave Journal introduces advances in commercially available solutions for characterization, modeling, and design of nonlinear components and systems based on X-parameters

기사 2009-10-09

PDF PDF 1.92 GB
Video Demos on Generating X-Parameters from Circuit Level Designs 
This four part series of demonstration videos shows how to generate X-parameters from circuits.

기본 데모 2009-09-28

 
Agilent Technologies Unveils Newest Solutions for Microwave, RF, Wireless, Radar Test 
At the 2009 European Microwave Conference.

보도자료 2009-09-22

 
Solutions for Characterizing and Designing Linear Active Devices 
This short application brief discusses how to accurately characterize a devices’ nonlinear behavior.

어플리케이션 노트 2009-08-21

X-parameters News 
Press Releases related to Agilent's X-parameters

보도자료 2009-08-21

 
Agilent Announces Availability of Powerful New TriQuint PDK that Streamlines MMIC Design Process 

보도자료 2009-06-08

 
Extension of X-parameters to Include Long-Term Dynamic Memory Effects 
IEEE MTT-S International Microwave Symposium Digest, Boston

어플리케이션 노트 2009-06-05

 
Agilent Technologies Expands World's Most Flexible PNA-X Network Analyzer for Active Device Test 

보도자료 2009-06-01

 
Setting a New Standard for Flexible Network Analyzers  

보도자료 2009-06-01

 
Agilent Announces Industry’s First Complete, Front-to-Back Solution for MMIC, RF Module 
Advanced Design System Release Enables Designers to Stay in their Preferred Design Platform, Eliminates Need for Point Tools

보도자료 2009-06-01

 

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