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Measuring Characteristic Impedance of Short Rambus Motherboard Traces (AN 1304-4) 
This application note tells you how to perform characteristic impedance measurements on Rambus motherboards and SO-RIMM's using TDR with normalization and verification.

Application Note 2000-11-01

PDF PDF 426 KB
Languages 
Medalist i3070 In Circuit Test – Utilizing the most comprehensive Limited Access 
This article introduces the seven most prominent and effective limited access tools on the Agilent Medalist i3070 ICT, collectively known Super 7 suite.

Application Note 2009-03-06

PDF PDF 342 KB
NDF and RTF - Hashed Names 
There have been many questions about hashed directory names. This is a brief explanation of why they are, and how they are generated.

Application Note 1998-06-30

 
New Features in Version 5.0 Software for 3070 
Typically, when Agilent's Manufacturing Test Division introduces a new software revision for its flagship 3070 In-Circuit Tester, it only communicates with customers about the major new features.

Application Note 2003-01-28

PDF PDF 84 KB
Non-Contact Measurement Method for 13.56 MHz RFID Tags Using the ENA/ENA-L Network Analyzer 
For engineers working in RFID antenna design and test, this note discusses a non-contact method for measuring resonant frequencies of RFIDs using a network analyzer.

Application Note 2009-02-20

PDF PDF 199 KB
Non-Volatile Memory Programming on the Agilent 3070 
The trend in non-volatile memory, like the general trend in electronic products, is to increase capability, reduce size, reduce cost, and get the final product to market faster than the competition.

Application Note 2003-05-29

PDF PDF 28 KB
Obtaining a Listing of Applications on Series II Systems 
There is currently no easy way to obtain a list of all resident applications on a 5DX System or TDW. It is difficult to match panel name with hash name and see when the application was last updated.

Application Note 2002-06-01

 
PLD Programming on the Agilent 3070 Using the PLD ISP Product 
In-System Programmable PLDs are more widely used on today's boards to provide flexibility to design engineers and to reduce the cost of a product.

Application Note 2002-02-26

PDF PDF 242 KB
PLR and 5DX Customized Defect Names Implementation 
You can use customized defect names on both the 5DX and on the PLR. This is particularly valuable when you want to display defect names in a local language.

Application Note 2003-03-01

 
Preparing a .cc File for Export to Test Link 
This procedure describes the process of converting ECAD data into a form that can be used by Test Link.

Application Note 2002-10-16

PDF PDF 70 KB
Printed Circuit Board Split-Pad Test Method and Design 
This application note describes the split-pad concept for use with a bed of nails style test fixture.

Application Note 1999-06-01

PDF PDF 50 KB
Problem with Subtype Learning When Used with the Connector Algorithm in R7.0 
5DX Technical Paper - Problem with Subtype Learning When Used with the Connector Algorithm in R7.0

Application Note 2004-02-20

PDF PDF 16 KB
Realizing the Benefits of 3D Inline Solder Paste Inspection 
Published in SMT Magazine/Germany, August 2003

Application Note 2003-08-01

PDF PDF 67 KB
Reducing Load Time for Loaderless Systems 
For Series 2L systems, it may be possible to reduce the time it takes to load a panel.

Application Note 1999-12-01

 
Reducing Process Defect Escapes with Vectorless Test 
Process defects that escape in-circuit test lead at best to increased repair costs, and at worst to a "bone pile1" problem.

Application Note 2001-05-17

PDF PDF 512 KB
Remote Network Connections Creation for the Operator Logon 
Operator logon on the Agilent 5DX Series II System is limited, in that it does not allow Operator to make network connections that are required for sending images and res files to the PLR workstation.

Application Note 2002-06-30

 
Rotating Boards on a Panel 
Rotating Boards on a Panel if often necessary. In addition to the software revisions named within, the explained technique in the document is utilized for for 4.x, 5.x, 6.x and 7.x. For 8.x Test Link deals with this automatically.

Application Note 2001-05-17

PDF PDF 40 KB
Running Rocky Mountain Basic from Board Test Basic 
Many of you have existing programs written in Rocky Mountain Basic (RM-Basic), or have found the RM-Basic program examples given in Agilent manuals, and wish to use them to do external instrumentation control using the Agilent 3070 Board Test Family.

Application Note 2001-05-17

PDF PDF 23 KB
Sampling on the Agilent 5DX 
Sampling Mode allows test coverage to be optimized with line speed. This document explore the setup procedure for the Agilent 5DX for sampling.

Application Note 2002-05-08

 
Selective Retrieval for Agilent 3070 Board Test Systems with UNIX Controllers 
Most users are very diligent about backing-up their systems in the event of a catastrophic disk failure. Typically, you use SAM to set-up periodic automated backups or create a "crontab" entry to do this.

Application Note 1996-07-01

 
SEMI S2 Standard Modifications for Agilent 3070 and Related Equipment 
This document describes three items pertaining to the Agilent 3070 and the SEMI S2 standard. Each of them is related to a variance with the SEMI standard.

Application Note 2006-06-15

PDF PDF 52 KB
Series II Compliance with the Machinery Directive (in Europe) - specific installation procedures 
Series II will meet requirements of Machinery Directive in European Community member countries, if the following steps, which are described in the document, are taken during installation of equipment.

Application Note 2001-05-17

 
Solder Paste Inspection - Organize the Pieces 
Published in Global SMT & Packaging, November 2003

Application Note 2003-11-01

PDF PDF 818 KB
Solder Paste Inspection for the SMT line: 3D In-line Systems Come of Age 
Published in Electronic Production & Test, May 2003.

Application Note 2003-05-01

PDF PDF 115 KB
Synchronizing 3070 System Clocks 
These instructions are for synchronizing the system clocks of several network-connected UX workstations in the absence of an existing timeserver.

Application Note 2001-09-27

PDF PDF 66 KB

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