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Network Parameter Measurement: Best Practices using the Agilent Medalist i3070 
This paper describes how to maximize benefits from the Network Parameter Measurement capability on the Agilent Medalist i3070 in-circuit test system using enhancements in software version 7.20p.

Application Note 2009-04-02

PDF PDF 55 KB
New Features in Version 5.0 Software for 3070 
Typically, when Agilent's Manufacturing Test Division introduces a new software revision for its flagship 3070 In-Circuit Tester, it only communicates with customers about the major new features.

Application Note 2003-01-28

PDF PDF 84 KB
Non-Contact Measurement Method for 13.56 MHz RFID Tags Using the ENA/ENA-L Network Analyzer 
For engineers working in RFID antenna design and test, this note discusses a non-contact method for measuring resonant frequencies of RFIDs using a network analyzer.

Application Note 2009-02-20

PDF PDF 199 KB
Non-Volatile Memory Programming on the Agilent 3070 
The trend in non-volatile memory, like the general trend in electronic products, is to increase capability, reduce size, reduce cost, and get the final product to market faster than the competition.

Application Note 2003-05-29

PDF PDF 28 KB
Obtaining a Listing of Applications on Series II Systems 
There is currently no easy way to obtain a list of all resident applications on a 5DX System or TDW. It is difficult to match panel name with hash name and see when the application was last updated.

Application Note 2002-06-01

 
Optical Spectrum Analyzer Amplifier Test Application (PN 86140-5) 
The product note explains how the Agilent OSA amplifier test application provides a cost-effective solution for reducing test time.

Application Note 2002-03-15

PDF PDF 642 KB
Optimizing Bluetooth Device Battery Drain Measurements in Manufacturing (AN 1396) 
This application note discusses optimizing battery drain measurements in manufacturing test for Bluetooth devices.

Application Note 2002-04-03

PDF PDF 250 KB
Languages 
Optimizing Power Savings on WiMax and Other Cellular WWAN Interface Devices 
This document describes how to optimze power savings on WiMax and other cellular WWAN interface devices.

Application Note 2008-07-15

PDF PDF 658 KB
Languages 
Performing Two-Tone Measurements with the Agilent 8360 (PN 8360-4) 
This Product Note illustrates how to use two Agilent 8360 synthesized sweepers to obtain two tracking signals offset by a fixed frequency (fixed offset).

Application Note 2001-01-11

PDF PDF 84 KB
Phased Locked Loop Acquisition Using a Swept Local Oscillator 
This Application Note details the Phased Locked Loop Acquisition Using a Swept Local Oscillator.

Application Note 2000-03-02

PDF PDF 440 KB
Languages 
PLD Programming on the Agilent 3070 Using the PLD ISP Product 
In-System Programmable PLDs are more widely used on today's boards to provide flexibility to design engineers and to reduce the cost of a product.

Application Note 2002-02-26

PDF PDF 242 KB
PLL’s using a Charge Pump, High Divide-by-N Factors, and Decimation before Plotting 
This Application Note shows an approach for designing a phase locked loop (PLL) that uses a charge pump, High Divide-by-N Factors, and Decimation before Plotting.

Application Note 2001-03-20

PDF PDF 316 KB
Languages 
PLR and 5DX Customized Defect Names Implementation 
You can use customized defect names on both the 5DX and on the PLR. This is particularly valuable when you want to display defect names in a local language.

Application Note 2003-03-01

 
PNA - Antenna - Pulsed Measurements 
This paper presents advances in the instrumentation techniques that can be used for the measurement and characterization of antennas that are to be tested in a pulsed mode of operation.

Application Note 2004-01-06

PDF PDF 312 KB
Languages 
PNA - Antenna Measurement Triggering 

Application Note 2003-05-28

PDF PDF 116 KB
Languages 
PNA - Antenna/RCS - Reduce Measurement Test Times 
This white paper describes new technology features applicable to antenna/RCS measurements, configuration diagrams, typical antenna/RCS measurement scenarios, and measurement time comparisons.

Application Note 2004-12-20

PDF PDF 98 KB
Languages 
PNA - Mixers - Absolute Group Delay of Multistage Converters 
This paper describes new calibration and measurement techniques for measuring absolute group delay of frequency converters with multiple mixing stages

Application Note 2003-11-24

PDF PDF 505 KB
Languages 
PNA - Mixers - Advances in Converter Test 
Agilent 2005 Aerospace Defense Symposium presentation

Application Note 2006-04-24

PDF PDF 2.12 MB
Practical Noise-Figure Measurement and Analysis for Low-Noise Amplifier Designs (AN 1354) 
This Application Note is a timely and detailed examination of the process needed for making practical noise figure measurements of low-noise amplifiers which includes software modeling.

Application Note 2000-09-01

PDF PDF 1.65 MB
Practical RF Amp. Design Using the Available Gain Procedure & the ADS EM/Circuit Co-Sim. Capability 
This white paper features a method of designing a low noise RF amplifier for an 802.11b receiver application and contains an Avago ATF54143 PHEMT transistor.

Application Note 2009-06-25

PDF PDF 5.49 MB
Languages 
Preparing a .cc File for Export to Test Link 
This procedure describes the process of converting ECAD data into a form that can be used by Test Link.

Application Note 2002-10-16

PDF PDF 70 KB
Printed Circuit Board Split-Pad Test Method and Design 
This application note describes the split-pad concept for use with a bed of nails style test fixture.

Application Note 1999-06-01

PDF PDF 50 KB
Problem with Subtype Learning When Used with the Connector Algorithm in R7.0 
5DX Technical Paper - Problem with Subtype Learning When Used with the Connector Algorithm in R7.0

Application Note 2004-02-20

PDF PDF 16 KB
Quad Flat No Lead (QFN) Best Practices 
The purpose of this application note and best practices guide is to describer the QFN-type component and provide testing methods to ensure robust testing on the Medalist 5DX Automated X-ray Inspection (AXI) System.

Application Note 2008-08-26

PDF PDF 492 KB
Realizing the Benefits of 3D Inline Solder Paste Inspection 
Published in SMT Magazine/Germany, August 2003

Application Note 2003-08-01

PDF PDF 67 KB

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