Basics & Measurement Fundamentals
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51-75 of 271
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Calibration of Time Base Oscillators - White Paper
As more accurate clocks were produced, new uses of time measurement were explored. As new uses were discovered, the need for even more accurate clocks became apparent.
Application Note 2012-12-21 |
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Calibration Process Innovation Using Non-Required Guard Banded Testing by Richard Ogg
Calibration services vary as to how to set the acceptance limits compared to the required tolerance. Using a guard band to reduce the acceptance limit will increase the confidence in the calibration.
Application Note 2011-09-30 |
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CDPD MDBS Cell Site Test Software Troubleshooting
This Product Note is a troubleshooting guide designed to answer the most problematic and typical questions that occur when testing a CDPD MDBS with the Agilent Technologies 8921A CDPD test solution.
General situations
Data collection does not work
A parameter you changed does not...
Application Note 1997-06-01 |
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Cellular Call Processing: Programming Techniques for the Agilent (AN 8920A)
This Application Note specifically describes the programming format for AMPS cellular, however the techniques are similar for systems like NAMPS and TACS. The programming techniques used for the Agilent Technologies 8920A firmware have built-in cellular call processing functions. These techniques...
Application Note 1995-10-01 |
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Choosing Your Test System Software Architecture (AN 1465-4)
Application Note 2004-12-21 |
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Choosing Your Test-System Hardware Architecture & Instrumentation (AN 1465-5)
Application Note 2004-12-21 |
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Comparing AOI and AXI
Choosing the right technology requires looking at board mix, capital budget and other business considerations. But most of all, you need to understand the typical characteristics of each technology.
Application Note 2001-07-25 |
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Comparing CAD and BOM data for 5DX Use
Instructions for comparing CAD and BOM data to quickly deal with no load components.
Application Note 2008-01-04 |
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Comparing the Accuracy and Repeatability of On-Wafer CalibrationTechniques to 110 GHz
by Cascade Microtech
Application Note 2000-03-16 |
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Comparison of Different Jitter Analysis Techniques With a Precision Transmitter
This white paper describes how various jitter analysis techniques give dissimilar results. Which is right? We built a precision jitter transmitter to compare results of different techniques where test sets were exposed to known levels of jitter.
Application Note 2006-04-06 |
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Connecting a UPS to a 3070 Controller
This paper describes how to connect a UPS to the 3070 testhead controller. It uses the Advanced Power Conversion Smart-UPS with PowerChute Plus software.
Application Note 2003-01-07 |
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Connector Pin Recession and its Effect on Network Analyzer Accuracy - White Paper
Outlines an experiment undertaken to assess the impact on the measurement of reflection coefficient when using 3.5 mm connectors.
Application Note 2012-10-24 |
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Considerations for Surface Map Setup
The concept of delta-Zs is perhaps the most difficult thing to understand about the surface map process.
Application Note 2006-08-08 |
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Converting 8924C software for the E8285A
This Product Note assumes you are converting
software originally written for the Agilent 8924C, for use with the Agilent E8285A. Ideas are also included for modifying your software to function interchangeably with both the 8924C and the E8285A. This Note is meant to supplement the information...
Application Note 2000-07-01 |
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Cryogenic On-Wafer Measurement Techniques to 18K
by Cascade Microtech
Application Note 2002-01-17 |
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Crystal Oscillator Testing - White Paper
A policy concerning the testing of the reference oscillators contained within many instruments has been defined and adopted in Agilent's service centers worldwide.
Application Note 2012-12-21 |
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Dealing with Board Thickness Variations
The Agilent 5DX has the capability to be implemented such that it can accommodate thickness variations on a board-by-board basis. NOTE: Content described is in the 5DX Reference Guide but is no longer in Chapter 7 as mentioned herein.
Application Note 2001-05-16 |
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Design for Testability - Test for Designability
This paper addresses testability considerations, both physical and logical, and focuses on both the new constraints and the new freedoms of modern manufacturing test in the ever-changing challenge.
Application Note 2003-01-28 |
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Diagnostic Testing and the Medalist 5DX Automated X-ray Inspection System
Users of the Medalist 5DX automated x-ray inspection system can benefit from running diagnostic tests on a regular basis. This application note provides some guidelines.
Application Note 2009-01-14 |
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Digital Basics for Cable Television Systems
If you install, upgrade, or maintain digital or mixed digital/analog systems, this book is your complete guide to this new world.
Application Note 2001-07-19 |
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Discharge on Unpowered Agilent 3070 Systems
This paper is applicable to both powered and unpowered Agilent 3070 systems, but does not explain how a discharge routine is created on an Unpowered system.
Application Note 2003-06-13 |
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Discreet Analog Device Testing
The Agilent 3070 series has quite a few built in features to make developing board tests easier, while protecting the operator, the board under test, and the 3070 itself from harm.
Application Note 1998-10-29 |
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Effects of Lead Free Solders on Imaging Characteristics of the Agilent 5DX Laminographic X-ray Test
The electronics industry is under pressure to migrate solder processes away from the usage of eutectic tin-lead solder and towards utilization of lead-free compounds.
Application Note 1998-05-01 |
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Electrical In-circuit Test Methods for Limited-access Boards
This paper surveys the various electrical test methods and tools available to address testing boards that lack full electrical access.
Application Note 2001-02-27 |
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ENA/PNA - Mixers - Calibration Accuracy using FCA (1408-3)
Improving Measurement and Calibration Accuracy Using the Frequency Converter Application - AN 1408-3
Application Note 2006-08-08 |
