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A New Process for Measuring and Displaying Board Test Coverage 
Written by Kenneth P. Parker, Agilent Technologies. First presented at Apex 2003, Anaheim, California.

Application Note 2003-01-01

PDF PDF 116 KB
When to Use AOI, When to Use AXI, and When to Use Both 
by Stig Oresjo, senior test strategy consultant at Agilent Technologies.

Application Note 2002-12-01

PDF PDF 70 KB
Optimizing Power Product Usage to Speed Design Validation Testing (AN 1434) 
This 15-page application note presents methods and techniques to decrease setup time and test time.

Application Note 2002-11-22

PDF PDF 130 KB
Languages 
Preparing a .cc File for Export to Test Link 
This procedure describes the process of converting ECAD data into a form that can be used by Test Link.

Application Note 2002-10-16

PDF PDF 70 KB
UNIX vs. Windows Differences for 3070 Users 
This documentation serves as a PC transition guide to help existing 3070 customers migrate from the Unix platform to the PC platform.

Application Note 2002-09-19

 
Windows & Unix Feature Comparison 
The Windows & Unix 3070 Feature Comparison document provides a detailed listing of features translated to the Windows based 3070 from the Unix based 3070.

Application Note 2002-07-31

PDF PDF 71 KB
3070 In System Programming (ISP) Family 
On Board Programming, Bottom Line Benefits

Application Note 2002-07-25

PDF PDF 200 KB
Remote Network Connections Creation for the Operator Logon 
Operator logon on the Agilent 5DX Series II System is limited, in that it does not allow Operator to make network connections that are required for sending images and res files to the PLR workstation.

Application Note 2002-06-30

 
Maintaining Power with Dual Stage Fixtures 
Occasionally there is a need to do dual stage fixturing where power must be maintained during parts of both stages.

Application Note 2002-06-07

PDF PDF 48 KB
Using NDFCOL.EXE, the NDF "Line Up the Columns" Utility 
NDFCOL.EXE is a handy little utility that will form neat columns of data in NDF files.

Application Note 2002-06-06

 
Obtaining a Listing of Applications on Series II Systems 
There is currently no easy way to obtain a list of all resident applications on a 5DX System or TDW. It is difficult to match panel name with hash name and see when the application was last updated.

Application Note 2002-06-01

 
Sampling on the Agilent 5DX 
Sampling Mode allows test coverage to be optimized with line speed. This document explore the setup procedure for the Agilent 5DX for sampling.

Application Note 2002-05-08

 
Agilent 3070 Outsource Series Pay-Per-Use Board Test System 
With an Agilent 3070 Outsource Pay-Per-Use System, you can define your system according to the products you have to test.

Application Note 2002-03-08

PDF PDF 247 KB
PLD Programming on the Agilent 3070 Using the PLD ISP Product 
In-System Programmable PLDs are more widely used on today's boards to provide flexibility to design engineers and to reduce the cost of a product.

Application Note 2002-02-26

PDF PDF 242 KB
Effective Multitap Transformer Testing Using a Scanner (AN 1224-5) 
This Application Note shows an effective multi-tap transformer measurement using a scanner and the Agilent 4263B LCR Meter.

Application Note 2001-11-05

PDF PDF 945 KB
Languages 
The Life of a 5DX Inspection C# File 
The {Hashed Panel Name}.C# file is basically cad information about a panel program. It is used in conjunction with various utilities to overlay cad data on images or provide cad data for filters.

Application Note 2001-10-16

PDF PDF 97 KB
Synchronizing 3070 System Clocks 
These instructions are for synchronizing the system clocks of several network-connected UX workstations in the absence of an existing timeserver.

Application Note 2001-09-27

PDF PDF 66 KB
3070 Series 3 Flash70 Programming Guide 
This guide contains information about the procedures, tasks, and syntax required to perform flash programming with HP 3070 test systems.

Application Note 2001-09-12

PDF PDF 1.85 MB
Breakthrough Innovations: Agilent Automated Silicon Nails 
Automated Silicon Nails takes the popular IEEE 1149.1 Boundary-Scan standard even further by using Boundary-Scan chains to automatically test non-Boundary-Scan devices.

Application Note 2001-08-15

PDF PDF 460 KB
3070 Board Tests are Reliable, Repeatable and Transportable. Here's Why. 
It would take a very long paper to discuss all of the factors that make Agilent 3070 tests so reliable, repeatable, and transportable. This paper selects a few of the important ones.

Application Note 2001-08-15

PDF PDF 223 KB
Version 7.x ASAP Best Practices  
In an effort to standardize programming practices for the Agilent 5DX, Agilent has created a set of procedures representing 5DX "best practices" that address various aspects of the programming process.

Application Note 2001-07-25

 
Comparing AOI and AXI 
Choosing the right technology requires looking at board mix, capital budget and other business considerations. But most of all, you need to understand the typical characteristics of each technology.

Application Note 2001-07-25

PDF PDF 42 KB
In-System Programming on the Agilent 3070 
In-System Programmable devices are more widely used on today's boards to provide flexibility to design engineers and to reduce the cost of a product.

Application Note 2001-07-02

PDF PDF 205 KB
Tying a Power Supply to Multiple Boards in a Panel 
If you have a situation with multiple boards on a panel, and you need to wire one or more power supplies to each board, you often can wind up with problems wiring power and ground. Usually, you'll see warnings of the type FXT66.

Application Note 2001-06-12

PDF PDF 16 KB
Writing Flash Memory with Agilent 3070 Systems 
Flash memory is traditionally programmed on PROM programmers, but some manufacturers report a one percent damage rate due to the extra handling steps required!

Application Note 2001-05-18

PDF PDF 31 KB

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