Contact an Expert

Signal Integrity

Use advanced SI tools to define next-generation processes

Whether you perform signal integrity analysis independently or as a tightly integrated part of the digital design process, the breadth of tools available from Agilent can help you find problems today and prevent problems in the future. Agilent - achieve your best design.

Related Links

Refine the List

remove all refinements

By Type of Content

By Product Category

1-16 of 16

Sort:
8 Hints for Debugging and Validating High-speed Buses 
8 Hints for Debugging High-speed Buses

Application Note 2002-03-05

PDF PDF 2.24 MB
DDR4 TdiVW/VdiVW Bit Error Rate Measurement or Understanding Bit Error Rate 
Importance of making BER measurement calculations to form a statistical measurement of total jitter to understand the design's data valid window result and design error rates.

Application Note 2013-01-24

PDF PDF 1.65 MB
Designing High Speed Backplanes Utilizing Physical Layer Test System 
This Application Note focuses on the problems introduced into the backplane assembly design by the many linear passive components that create reflections due to impedance discontinuities.

Application Note 2006-01-18

PDF PDF 1.24 MB
Languages 
Effective Reflection Characterization for Active Devices Using ENA Option TDR Application Note 
This application note describes Hot TDR measurement, which is an effective characterization method for the reflection of transmitter and receiver.

Application Note 2012-01-12

PDF PDF 416 KB
Languages 
Limitations and Accuracies of Time and Frequency Domain Analysis of Physical Layer Devices 

Application Note 2005-11-01

PDF PDF 2.83 MB
Languages 
Measuring Jitter in Digital Systems (AN 1448-1) 
Measuring jitter and how to calculate total jitter.

Application Note 2008-01-30

PDF PDF 1.91 MB
Preselector Tuning for Amplitude Accuracy in Microwave Spectrum Analysis 
This 8 page application note introduces the technique for broadband modulated signals employed in the new MXA signal analyzer.

Application Note 2009-08-14

PDF PDF 387 KB
Languages 
S-Parameter Techniques for Faster, More Accurate Network Design (AN 95-1) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1967-02-01

PDF PDF 3.10 MB
Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, & 2-Port TDR 
This Application Note focuses on part 1: those which use a single-port TDR, those which use TDR/TDT, and those which use 2-port TDR.

Application Note 2007-01-01

PDF PDF 3.50 MB
Signal Integrity Analysis Series Part 2: 4-Port TDR/VNA/PLTS 
This Application Note focuses on part 2: those which use a 4-port TDR/VNA/PLTS.

Application Note 2007-02-21

PDF PDF 2.75 MB
Signal Integrity Analysis Series Part 3: The ABCs of De-Embedding 
This Application Note focuses on Part 3: The ABCs of De-Embedding explaining different de-embedding techniques & shows how to minimize fixture effects for best results.

Application Note 2007-07-01

PDF PDF 2.44 MB
Transforming Oscilloscope Acquisitions for De-Embedding, Embedding and Simulating Channel Effects 
Covers fundamentals of understanding the design parameters, the various methods of data acquisition and implementing the results into a first-class design

Application Note 2012-03-05

PDF PDF 2.33 MB
Languages 
Understanding Signal Integrity 
This is a technical note that was featured in the AMS Newsletter, Volume 1, Issue 2. This technical note discusses the problems that engineers have with signal integrity and solutions to help address the problems.

Application Note 2002-04-18

PDF PDF 287 KB
Understanding the Kramers-Kronig Relation Using A Pictorial Proof 
The Kramers-Kronig relation lets us build a causal time-domain model from bandlimited s-parameters. This pictorial proof aids understanding of the physics of causality and hence the validity of this approach.

Application Note 2010-03-31

PDF PDF 238 KB
Languages 
Using ADS for Signal Integrity Optimization 
This white paper shows how to replace a multi-dimensional sweep of a long running PRBS time-domain simulation (including manual data evaluation) by short, channel-pulse characterization in the Advanced Design System to efficiently optimize a channel.

Application Note 2009-10-19

PDF PDF 275 KB
Languages 
Using Clock Jitter Analysis to Reduce BER in Serial Data Applications 
This Application Note emphasizes on the emerging techniques for reference clock jitter analysis from the perspective of oscillator physics, phase noise theory, and serial data technology.

Application Note 2006-12-01

PDF PDF 1.15 MB
Languages