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Focus where it counts

Missions evolve but one thing stays the same: the need to protect those who go in harm´s way. Success depends on a changing mix of people and technology ― and as technology becomes more complex, assuring readiness gets tougher.

Agilent is a source of assurance that your mission will succeed. Through our expertise in measurement science and test processes, we give you more time for the bigger issues: fulfilling today´s mission and managing the transition to what comes next. By helping you build greater assurance in system readiness, Agilent frees you to focus where it counts most.

See Measurement Solution Examples: Active Antenna Test, Multi-Emitter Environment Test Signals

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Application of Agilent's PNA-X NVNA and X-Parameters in Power Amplifier Design 
This 16-page article appeared in Microwave Journal's May 2011 issue; teaches you how to obtain actual linear and nonlinear component behavior to improve power amplifier design using Agilent's solutions.

Application Note 2011-05-01

Evaluating and Optimizing High-power Amplifier Designs with X-Parameter Techniques 
This brief presents an example PA design that uses a 45-watt GaN transistor. The center operating frequency is 1.2 GHz and the target output power is 45 dBm or more.

Application Note 2011-04-28

The Coming of Age of the Software Communications Architecture 
Microwave Jounral article reprint on Software Defined Radio (SDR) technology, development tools for complex waveforms and radio applications in aerospace/defense and commercial applications.

Article 2011-04-24

PDF PDF 1.61 MB
Measuring Performance of Wide Bandwidth Radar Transmitters 
Short videos on measuring performance of wide bandwidth radar transmitters.

Demo 2011-04-21

 
Optimizing Throughput in Transmit/Receive Module Test 
This application brief illustrates modern trends of testing by focusing on transmit/receive (T/R) modules used in radar systems.

Application Note 2011-04-12

Solar Array Simulation System Integration 
This technical overview introduces you to important considerations when designing a SAS system. It is important to understand the heat sources inside the rack and how they can affect the operation...

Technical Overview 2011-04-08

PDF PDF 271 KB
Fundamentals of RF and Microwave Power Measurements (Part 3) (AN 1449-3) 
Power Measurement Uncertainty per International Guides AN 1449-3, literature number 5988-9215EN

Application Note 2011-04-05

Tackling the Mixed-signal Testing Challenges of SDR 
Software-defined radios (SDR) utilize a combination of FPGAs, DSPs and analog/RF designs to achieve the radio’s system performance.

Article 2011-03-09

 
Streamlining Field Test with Task Planner 
For use with Agilent N9344C/43C/42C handheld spectrum analyzers (HSAs)

Application Note 2011-02-25

New Geolocation Methods Using RF Sensor Networks 
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Press Materials 2011-02-22

 
Self-diagnosing Switch Matrix 

Demo 2011-02-16

 
Using SystemVue’s Radar Library to Generate Signals for Radar Design and Verification - App Note 
Agilent's Radar Library helps you with the productivity and accuracy of your radar signals.

Application Note 2011-01-25

EE Times & Agilent Blog: Tradeoff: Dynamic range and bandwidth in signal analysis 
Two different ways of looking at noise figure.

Article 2011-01-23

 
Agilent Technologies Awarded $1.8 Million Contract by U.S. Navy for Handheld Spectrum Analyzers 
Press Release

Press Materials 2011-01-23

 
EE Times & Agilent Blog: The changing face of electronic test instrumentation 
The changing face of electronic test instrumentation.

Article 2011-01-12

 
Wideband Radar + SATCOM Measurements 
Growing trends in SATCOM and radar systems in the A/D market.

Feature Story 2011-01-12

 
Reducing Measurement Times in Antenna and RCS Applications 
To help you achieve these speed improvements, this note describes test range configurations and typical measurement scenarios.

Application Note 2010-12-20

PDF PDF 3.15 MB
Custom OFDM Signal Generation Using SystemVue 
This application note describes a new comms standard based on OFDM which is provided by SystemVue 2011 to create both simulation and measurement, with links to the new 89600B VSA software for further demodulation and analysis.

Application Note 2010-12-09

Custom OFDM Waveform Creation Using SystemVue  
YouTube™ video

Demo 2010-12-03

 
Agilent Technologies to Showcase Custom OFDM Waveform Design at 2010 Wireless Innovation Forum  
Press release.

Press Materials 2010-12-01

 
Combining Simulation and Test to Accelerate SDR Development 
The note reviews the major attributes of SDRs then looks at two key topics: the use of multiple waveforms during SDR design and the use of simulation to add flexibility to SDR testing.

Application Note 2010-11-19

PDF PDF 2.22 MB
Switching Solutions 
This paper discusses Agilent's complete line of switching solutions. Switch components are introduced, followed by the various scale of switch matrix that is required in RF and microwave testing.

Application Note 2010-11-18

Defining a New Methodology for Radar System Design 
Article from Microwave Product Digest, October 2010, discussing the use of analysis suites for the design of advanced digital signal processing techniques.

Feature Story 2010-10-01

 
The Real “Total Cost of Ownership” of Your Test Equipment 
This paper covers a TCO model for electronic T&M equipment and shows how operating costs can be critical drivers in reducing total cost of ownership beyond simply lowering acquisition (capital) costs.

Application Note 2010-09-30

PNA-X Series Microwave Network Analyzer Brochure 
Learn how the PNA-X network analyzer provides complete linear and nonlinear compontent haracterization in a single instrument. Includes customer case studies, features, specs, and more.

Brochure 2010-09-24

PDF PDF 2.89 MB

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