Mobile Computing Application Solutions- MIPI

• Digital RF (DigRF) Test
  Dig RF 3G and Dig RF v4 protocol test solutions
• D-PHY Test Solutions
  MIPI D-PHY physical layer testing solutions
• M-PHY Test Solutions
  MIPI M-PHY test equipment for both RFIC and baseband
• CSI / DSI Test Solutions
  MIPI protocol- Camera Serial Interface (CSI) and Display Serial Interface (DSI) test

• Long Term Evolution - LTE Test - LTE Test - 3GPP Long Term Evolution test and design resources from Agilent. Learn about LTE Test Equipment from design automation to network deployment.
• WiMAX™ Test - Agilent resources for WiMAX™ test for Mobile WiMAX, Fixed WiMAX and WiBRO. Resources include WiMAX test equipment, WiMAX design solutions, application notes, webcasts and more.
• MIMO Test - Multiple Input, Multiple Output MIMO antenna technology as implemented in LTE, WiMAX™ and WLAN 802.11n. MIMO testing resources from Agilent.
• MIPI Alliance  
• Gain greater confidence in your DigRF designs - This video will demonstrate how the integrated test environment from Agilent Technologies will assist you through the different phases of the development process of both your digital and RF subsystems.
• System-Level Design of the LTE-Advanced Physical Layer - Preview the wireless industry's first commercial design personality for LTE-Advanced (3GPP Release 10), as part of the SystemVue 2011.03 environment.
• 802.11ac System Design and Verification Using the W1917 SystemVue WLAN library - Agilent SystemVue and the W1917 WLAN library are used for communications system design and verification of a 5GHz 802.11ac WLAN physical layer.

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• N4880A Reference Clock Multiplier - Accurate and simplified receiver testing for PCI Express, MIPI M-PHY and SD UHS-II
• Demo Video: Automated MIPI M-PHY Tx Compliance Tests
• New Mobile Computing Interfaces Architecture poster available - This FREE poster is designed to provide greater understanding of the complexities of mobile computing standards with a full range of digital and RF test solutions for MIPI® interfaces. Order your Agilent Mobile Computing Interfaces Poster today!

• Testing of RF ICs with DigRF Interconnects
  2009-09-11 | PDF 938 KB

  • Languages

    • English | 2009-09-11 | PDF 938 KB
    • 中文（繁體） | 2008-10-31 | PDF 940 KB
    • 한국어 | 2008-10-31 | PDF 940 KB
    • Français | 2009-02-11 | PDF 643 KB
    • Deutsch | 2009-02-02 | PDF 643 KB
• Using the Agilent Infiniium Series Real-time Oscilloscope to Validate the DigRF
  2009-05-27 | PDF 606 KB

  • Languages

    • English | 2009-05-27 | PDF 606 KB
    • 日本語 | 2007-09-07 | PDF 2.33 MB
• How to characterize the Physical Layer of the Mobile Industry Processor Interface (MIPI D-PHY)
  2007-07-30 | PDF 611 KB

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• Enabling MIPI Physical Layer Test- High Speed and Characterization
• Debugging and integrating MIPI DigRF enabled ICs in LTE and WiMAX mobile devices
• Driving Down Test Cost, Schedule & Risk with Smart Switching

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• Greater Insight into Wireless Connectivity
  2011-10-17 | PDF 1.56 MB
• DigRF Test Solutions Brochure
  2009-09-11 | PDF 2.18 MB
• Agilent Solutions for the DigRF v3 Digital Serial Interface Used In Mobile Wireless Devices
  2007-01-30 | PDF 521 KB

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• Agilent Introduces First-to-Market Functional Test Solution for MIPI D-PHY Standard Interconnects
  2011-10-04
• Agilent Launches Industry's First Complete MIPI M-PHY Test Suite
  2011-10-04
• Agilent Technologies' All-in-One MIPI D-PHY Test Platform Selected by ST Microelectronics
  2011-10-04

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• Specifications (8)
• Selection & Configuration Guides (1)
• Demos (17)
• Discussion Forums