Basics & Measurement Fundamentals

8 Hints for Making Better Spectrum Analyzer Measurements (AN 1286-1) This application note provides eight pertinent hints for making better spectrum analyzer measurements such as measuring low level signals and indentifying internal distortion products. Application Note 2009-09-07	PDF 739 KB Languages English \| 2009-09-07 \| PDF 739 KB 中文（简体） \| 2006-08-01 \| PDF 1.79 MB 日本語 \| 2007-02-05 \| PDF 1.40 MB
A Technique for Calibrating Phase Shifters to High Accuracy (AN 19) This Application Note is for information only. Agilent no longer sells or supports these products. Application Note 1966-05-01	PDF 3.84 MB
PNA - Pulsed-RF S-Parameter Measurements Using Wideband and Narrowband Detection (AN 1408-12) Application Note 2007-11-28	PDF 1.23 MB Languages English \| 2007-11-28 \| PDF 1.23 MB 中文（简体） \| 2008-04-11 \| PDF 1.97 MB 日本語 \| 2006-07-28 \| PDF 1.87 MB
Spectrum Analysis: Noise Measurements (AN 150-4) Application Note 150-4 Application Note 1974-04-01	PDF 10.46 MB
Test-System Computer I/O Considerations (AN 1465-2) - Application Note The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing Application Note 2004-12-09	PDF 189 KB