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  - Notes d’application (9)

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Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance Notes d’application 2008-10-15	PDF 281 KB Langues English \| 2008-10-15 \| PDF 281 KB 中文（简体） \| 2008-10-15 \| PDF 281 KB 日本語 \| 2008-10-15 \| PDF 1020 KB
Cathodic Protection of Steel in Concrete Using LXI This document discusss Cathodic protection as a remarkable technique that can substantially extend the life of a building structure by impeding corrosion. Notes d’application 2007-04-25	PDF 390 KB
Defining three classes of LAN eXtensions for Instrumentation (LXI) The LXI standard defines three types of instruments that can be readily mixed and matched within a test system. Notes d’application 2006-01-12
Migrating system software from GPIB to LAN/LXI (AN 1465-25) - Application Note Migrating system software from GPIB to LAN/LXIis the sixth application note in a series designed to help you manage the shift to LXI from GPIB. Notes d’application 2007-02-02	PDF 175 KB Langues English \| 2007-02-02 \| PDF 175 KB 中文（简体） \| 2007-02-02 \| PDF 175 KB 日本語 \| 2007-03-07 \| PDF 495 KB 中文（繁體） \| 2007-02-02 \| PDF 175 KB
Next-generation Test Systems: Advancing the Vision with LXI - Application Note This white paper provides an introduction to LXI, presents its advantages, and outlines usage models that expand the reach and capabilities-and perhaps the definition of test systems. Notes d’application 2006-05-03	PDF 190 KB Langues English \| 2006-05-03 \| PDF 190 KB 中文（简体） \| 2005-08-01 \| PDF 1.33 MB 日本語 \| 2005-06-10 \| PDF 781 KB
Standardized Core Makes Building and Supporting a Functional Test System Easier and Less Costly This note demonstrates how to use LXI instruments to create a standardized core - the open test platform (OTP), for building test systems. Notes d’application 2007-02-23	PDF 234 KB Langues English \| 2007-02-23 \| PDF 234 KB 中文（简体） \| 2007-07-04 \| PDF 625 KB 日本語 \| 2005-02-17 \| PDF 960 KB
Using IVI For Your Instrument Driver This application note describes the use of IVI drivers in your test system to determine when IVI is the right choice Notes d’application 2008-11-14	PDF 344 KB Langues English \| 2008-11-14 \| PDF 344 KB 中文（简体） \| 2008-11-14 \| PDF 344 KB 日本語 \| 2009-01-08 \| PDF 883 KB
Using LXI to Boost Throughput in Semiconductor Manufacturing This document is a case study that discusses the successful customer implementation of an Agilent LXI solution for a multinational semiconductor manufacturer Notes d’application 2007-04-25	PDF 234 KB
Using Synthetic Instruments in Your Test System (AN 1465-24) This note represents a brief history of SI, compares a rack-and-stack system to an SI-based system, descibes the initial applications of SIs, and illustrates the emulation of conventional instruments with SIs. Notes d’application 2006-08-28	PDF 290 KB Langues English \| 2006-08-28 \| PDF 290 KB 中文（简体） \| 2006-09-06 \| PDF 764 KB 日本語 \| 2006-09-14 \| PDF 461 KB 中文（繁體） \| 2006-08-28 \| PDF 290 KB