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어플리케이션별
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모든 어플리케이션
- LXI - LAN eXtensions for Instruments
분야별 검색결과
제품 카테고리별
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모든 제품 카테고리
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발생기, 소스, 공급기
- 신호 발생기 (신호 소스) (3)
- 펑션 / 임의 파형 발생기 (1)
- 펄스 패턴 발생기 (1)
- 데이터 발생기 및 분석기 (1)
- DC 전원 공급기 (4)
- 소스 측정 장치 (2)
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발생기, 소스, 공급기
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LXI(LAN eXtensions for Instrumentation)의 세 클래스 정의
LXI 표준은 한 테스트 시스템 내에서 쉽게 혼합 또는 정합시킬 수 있는 세가지 계측기 유형을 정의합니다.
어플리케이션 노트 2006-01-17 |
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Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance
어플리케이션 노트 2008-10-15 |
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Cathodic Protection of Steel in Concrete Using LXI
This document discusss Cathodic protection as a remarkable technique that can substantially extend the life of a building structure by impeding corrosion.
어플리케이션 노트 2007-04-25 |
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Migrating system software from GPIB to LAN/LXI (AN 1465-25) - Application Note
Migrating system software from GPIB to LAN/LXIis the sixth application note in a series designed to help you manage the shift to LXI from GPIB.
어플리케이션 노트 2007-02-02 |
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Next-generation Test Systems: Advancing the Vision with LXI - Application Note
This white paper provides an introduction to LXI, presents its advantages, and outlines usage models that expand the reach and capabilities-and perhaps the definition of test systems.
어플리케이션 노트 2006-05-03 |
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Standardized Core Makes Building and Supporting a Functional Test System Easier and Less Costly
This note demonstrates how to use LXI instruments to create a standardized core - the open test platform (OTP), for building test systems.
어플리케이션 노트 2007-02-23 |
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Using IVI For Your Instrument Driver
This application note describes the use of IVI drivers in your test system to determine when IVI is the right choice
어플리케이션 노트 2008-11-14 |
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Using LXI to Boost Throughput in Semiconductor Manufacturing
This document is a case study that discusses the successful customer implementation of an Agilent LXI solution for a multinational semiconductor manufacturer
어플리케이션 노트 2007-04-25 |
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Using Synthetic Instruments in Your Test System (AN 1465-24)
This note represents a brief history of SI, compares a rack-and-stack system to an SI-based system, descibes the initial applications of SIs, and illustrates the emulation of conventional instruments with SIs.
어플리케이션 노트 2006-08-28 |
