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Satellites

"Get it right the first time" takes on a larger meaning with satellites going into Earth´s orbit or traveling deep into space. From guidance systems to satellite payloads to microwave communications, design and validation tools from Agilent provide greater assurance that your satellite and its subsystems will work the first time, every time for the duration of the mission.

See a summary of this test equipment optimized for Satellite Applications.

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High Power Amplifier Measurements Using Agilent's Nonlinear Vector Network Analyzers AN 1408-19 
This application note discusses the unique challenges involved in testing high-power devices using Agilent's N5242A nonlinear vector network analyzer(NVNA).

Application Note 2010-01-26

High-Power Measurement Using The E5072A Network Analyzer Application Note 
This application note describes how to make high-power measurements with unique functions of the E5072A network analyzer.

Application Note 2011-12-23

Measuring Group Delay of Frequency Converters with Embedded LO 

Application Note 2007-09-26

Network Analysis - Mixers - Characterize Frequency-Translating Devices (AN 1287-7) 
This Application Note explores current test equipment solutions and techniques that can be used to accurately characterize and test frequency-translating devices.

Application Note 2000-03-01

PNA - Antenna/RCS - Reduce Measurement Test Times 
This white paper describes new technology features applicable to antenna/RCS measurements, configuration diagrams, typical antenna/RCS measurement scenarios, and measurement time comparisons.

Application Note 2004-12-20

PNA - Pulsed-RF S-Parameter Measurements Using Wideband and Narrowband Detection (AN 1408-12) 

Application Note 2007-11-28

Simple Scalar Network Analysis of Frequency Converter Devices - Application Note 
This application note shows the way to make easy scalar network analysis or power measurement using the Agilent U2000 series USB power sensor with the ENA network analyzers.

Application Note 2013-01-28

PDF PDF 606 KB
Solutions for Characterizing High-Power Devices—Using X-parameters to Make Nonlinear Measurements of 
This “Solutions for…” app note discusses X-parameters used to properly characterize and understand the behavior of high power amplifiers, as engineers push them to their limit, into nonlinear operation.

Application Note 2010-03-04

PDF PDF 2.68 MB
Understanding RF/Microwave Solid State Switches and their Applications 
This note explains FET, PIN diode and hybrid solid state switches. It discusses benefits/disadvantages of each type of switch, which specifications to consider and why, and gives application examples.

Application Note 2010-05-21

PDF PDF 1.07 MB