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Satellites
"Get it right the first time" takes on a larger meaning with satellites going into Earth´s orbit or traveling deep into space. From guidance systems to satellite payloads to microwave communications, design and validation tools from Agilent provide greater assurance that your satellite and its subsystems will work the first time, every time for the duration of the mission.
See a summary of this test equipment optimized for Satellite Applications.
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1-25 of 39
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10 Practical Tips You Need to Know about Your Power Products
Learn ten simple ways to improve your testing capabilities with your power supplies and electronic loads.
Application Note 2007-09-21 |
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10 Reasons to Upgrade to a 16800 or 16900 Series Logic Analyzer
10 Reasons to Upgrade to a 16800 or 16900 Series Logic Analyzer
Application Note 2007-12-03 |
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6 Hints for Enhancing Measurement Integrity in RF/Microwave Test Systems
Application Note 2012-04-30 |
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71910A/P Wideband Receiver Product Note
Two-page product note describes how to measure complex signals in digital communications satellite test with wideband spectrum analysis and modulation analysis tools. Containsapplications and additional information.
Application Note 2000-09-01 |
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Agilent LXI Class-B E5818A Trigger Box - Understanding Its Capability and Use Cases
Learn more about the LXI Class B E5818A trigger box and its capabilities through this white paper. You will also discover how to create a precise time synchronization system over LAN or enhance trigger operations applications.
Application Note 2008-07-25 |
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Avoid DUT Damage by Sequencing Multiple Power Inputs Off Upon a Fault Event
Having the ability to control the power supply system itself can greatly reduce the effort and complexity associated with an external shut-down control method.
Application Note 2007-12-05 |
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Calibrating Signal Paths in RF/Microwave Test Systems (AN 1465-19)
Application Note 2005-10-31 |
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Characterizing phase-locked-loop signal transition behaviors of Microphonic/Phase-hit
This paper discusses how Agilent's Signal Source Analyzer helps you to identify unwanted phase-locked-loop transition "phase-hits", and achieve easy, comprehensive and accurate phase-locked-loop characterization in both linear and nonlinear regions.
Application Note 2008-10-02 |
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Dynamic Power Analysis Techniques for Low-power Satellite Design Appilcation Note
Using high-performance DC sources to characterize and optimize dynamic current.
Application Note 2010-04-15 |
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Fundamentals of RF and Microwave Power Measurements (Part 1) (AN 1449-1)
Introduction to Power, History, Definitions, International Standards, and Traceability
AN 1449-1, literature number 5988-9213EN
Application Note 2003-04-17 |
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Fundamentals of RF and Microwave Power Measurements (Part 2) (AN 1449-2)
Power Sensors and Instrumentation AN 1449-2, literature number 5988-9214EN
Application Note 2006-07-05 |
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Fundamentals of RF and Microwave Power Measurements (Part 3) (AN 1449-3)
Power Measurement Uncertainty per International Guides
AN 1449-3, literature number 5988-9215EN
Application Note 2011-04-05 |
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Fundamentals of RF and Microwave Power Measurements (Part 4) (AN 1449-4)
An Overview of Agilent Instrumentation for RF/Microwave Power Measurements
AN 1449-4, literature number 5988-9216EN
Application Note 2008-09-01 |
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GPS Receiver Testing - Application Note
This paper describes GPS receiver tests used for GPS verification. It also introduces an application capable of generating the required GPS signals for a repeatable and flexible test environment.
Application Note 2010-01-04 |
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High Power Amplifier Measurements Using Agilent's Nonlinear Vector Network Analyzers AN 1408-19
This application note discusses the unique challenges involved in testing high-power devices using Agilent's N5242A nonlinear vector network analyzer(NVNA).
Application Note 2010-01-26 |
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High-Power Measurement Using The E5072A Network Analyzer Application Note
This application note describes how to make high-power measurements with unique functions of the E5072A network analyzer.
Application Note 2011-12-23 |
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Improved Methods for Measuring Distortion in Broadband Devices
This paper illustrates that, in broadband commercial and defense systems, it is more important than ever to characterize them for non-linearity.
Application Note 2008-12-10 |
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Improving Throughput with Fast RF Signal Generator Switching
This note describes techniques for optimizing RF signal generators within ATE systems to reduce test times and improve throughput.
Application Note 2007-09-19 |
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Low Cost Mixer for the 10.7 to 12.8 GHz Direct Broadcast Satellite Market (AN 1136)
This Application Note is for information only. Agilent no longer sells or supports these products.
Application Note 1999-11-01 |
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Making RF Measurements on Digital Serial Data with Agilent's Signal Extractor and the 89600 VSA
This application note is designed to guide you through making measurements on serial data using an Agilent logic analyzer with the B4602A Signal Extractor tool and Agilent's 89601A vector signal analyzer (VSA) software. (AN 1593)
Application Note 2007-05-08 |
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Measuring Group Delay of Frequency Converters with Embedded LO
Application Note 2007-09-26 |
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Network Analysis - Mixers - Characterize Frequency-Translating Devices (AN 1287-7)
This Application Note explores current test equipment solutions and techniques that can be used to accurately characterize and test frequency-translating devices.
Application Note 2000-03-01 |
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PNA - Antenna/RCS - Reduce Measurement Test Times
This white paper describes new technology features applicable to antenna/RCS measurements, configuration diagrams, typical antenna/RCS measurement scenarios, and measurement time comparisons.
Application Note 2004-12-20 |
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PNA - Pulsed-RF S-Parameter Measurements Using Wideband and Narrowband Detection (AN 1408-12)
Application Note 2007-11-28 |
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Sequential Shunt Regulation (AN 1293)
This sequential shunt regulation is widely used for regulating the satellite bus voltage. In this Application Note the Agilent E4350B/E4351B Solar Array Simulators (SAS) are ideal for regulating satellite bus voltage.
Application Note 2000-06-01 |
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