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无论您是从头开始还是更新现有系统，安捷伦系统元器件都可以帮助您轻松集成系统。安捷伦系统元器件包括可随时集成到系统中的仪器、开放式软件和PC标准I/O（LXI/USB/VXI/PXI）接口，它是帮助您完成优秀设计的理想工具。点击以下链接，查看如何充分发挥安捷伦资源和测试设备的作用

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1-16 / 16

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下一代测试系统：用LXI拓展视野 

应用说明 2005-08-01

PDF PDF 1.33 MB
语言 
使用 IVI 仪器驱动程序 
This application note describes the use of IVI drivers in your test system to determine when IVI is the right choice

应用说明 2008-11-14

PDF PDF 344 KB
语言 
在测试系统中使用合成仪器优势和劣势分析应用指南1465-24 

应用说明 2006-09-06

PDF PDF 764 KB
语言 
安捷伦标准内核能使功能测试系统的集成和支持更经济和容易 
安捷伦标准内核能使功能测试系统的集成和支持更经济和容易

应用说明 2007-07-04

PDF PDF 625 KB
语言 
将系统软件从GPIB过渡到LAN/LXI 

应用说明 2007-02-02

PDF PDF 175 KB
语言 
构建混合测试系统，确保在两个公共开发情景中取得成功 

应用说明 2008-10-15

PDF PDF 281 KB
语言 
测试系统开发指南AN1465-4 
测试系统开发指南AN1465-4

应用说明 2006-09-01

PDF PDF 1.09 MB
语言 
系统开发者指南:LAN在测试系统中的使用:网络配置 

应用说明 2004-12-28

PDF PDF 5.15 MB
语言 
System Developer Guide Using LAN in Test Systems - PC Configuration (AN 1465-11) - Application Note 
Using LAN in Test Systems: PC Configuration,the third note in the series, describes the additional capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10.

应用说明 2004-10-19

PDF PDF 204 KB
Test-System Computer I/O Considerations (AN 1465-2) - Application Note 
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing

应用说明 2004-12-09

PDF PDF 189 KB
Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note 
This application note answers common questions about the use of drivers and direct I/O to send commands from a PC application to the test instrument.

应用说明 2004-12-21

PDF PDF 374 KB
Using LAN in Test Systems - The Basics (AN 1465-9) - Application Note 
The basic purpose of any test system is to characterize and validate the performance of electronic components, assemblies or products. The complexity of this task depends on variables such as the physical nature of the device under test (DUT), the number of tests to be performed, the number of signals to be measured and the desired time per test.

应用说明 2004-07-29

PDF PDF 270 KB
Using LAN in Test Systems: Applications (1465-14) - Application Note and Example Programs 
Topics include balancing cost, convenience and security in three common LAN scenarios: sharing instruments, remote monitoring and data acquisition, and functional test systems. Includes downloadable example programs.

应用说明 2005-04-01

 
Using SCPI and Direct I/O vs. Drivers (AN 1465-13) - Application Note 
Using SCPI and Direct I/O vs. Drivers, the fifth note in the series, outlines the relationship between input/output (I/O) software, application software and the ability to maximize instrument interchange and software reuse in present and future systems

应用说明 2004-12-13

PDF PDF 408 KB
Using the VISA COM I/O API in .NET - Application Note 
The Microsoft .NET architecture has many features that make it an excellent environment for Test & Measurement programmers. VISA COM I/O is an update of the older VISA C API to work in and with COM technology.

应用说明 2007-03-16

PDF PDF 345 KB
Using USB in the Test and Measurement Environment (AN 1465-12) - Application Note 
Simplify test integration with USB interface. Whether you’re setting up an ad hoc system on a lab bench or designing a permanent solution for a manufacturing line, the three best choices today for connecting modern instrumentation to computers are GPIB, LAN, and USB.

应用说明 2004-11-19

PDF PDF 194 KB