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In digital standards, every generational change puts new risks in your path. We see it firsthand when creating our products and working with engineers like you. Agilent’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of. Agilent - achieve your best design.

Navigate the entire design cycle

Explore this web site for solutions within all four stages of the design cycle as well as the crucial—and integral—field of signal integrity analysis.

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Advanced Jitter Generation and Analysis Product Note 
This product note shows how the Agilent pulse generators can be used with the DCA-J Oscilloscope.

Notes d’application 2004-10-04

PDF PDF 549 KB
Automated PCI Express Receiver Compliance Test and Characterization with N5990A 
This product note shows how to use the test automation software platform to verify and debug your PCI Express bus designs. As an example, a multi-lane add-in card is used.

Notes d’application 2006-08-29

PDF PDF 444 KB
Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A 
Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A Software Platform: 8 pages

Notes d’application 2007-01-31

PDF PDF 272 KB
Calibrated Jitter, Jitter Tolerance Test and Jitter Laboratory with the Agilent J-BERT N4903A 
This application note describes the N4903A BERT characterization solution for emerging serial gigabit devices: it helps engineers make quick and accurate jitter tolerance tests, which have been complicated and hard to do in the past.

Notes d’application 2006-07-18

PDF PDF 5.33 MB
Characterizing Clock Jitter through Phase Noise Measurements Speeds up Design Verification Process 
This white paper discusses a new measurement method for obtaining highly accurate low random jitter (RJ) measurements and performing real-time analysis of RJ and periodic jitter (PJ) of components.

Notes d’application 2008-11-20

PDF PDF 688 KB
Langues 
Characterizing High-Speed Optical Transmitters Compliance Testing with the Agilent 86100A AN: 1340-1 
This application note will focus on the testing of opticaltransmitters used by three communications technologies:SONET/SHD, Gigabit Ethernet, and Fibre Channel.

Notes d’application 2000-08-01

PDF PDF 2.01 MB
Langues 
Comparison of Different Jitter Analysis Techniques With a Precision Transmitter 
This white paper describes how various jitter analysis techniques give dissimilar results. Which is right? We built a precision jitter transmitter to compare results of different techniques where test sets were exposed to known levels of jitter.

Notes d’application 2006-04-06

PDF PDF 164 KB
Debugging USB 2.0: It's Not Just A Digital World (AN 1382-3) 
Debugging USB 2.0 Systems

Notes d’application 2006-10-05

PDF PDF 392 KB
Langues 
Evaluating Microstrip with Time Domain Reflectometry (AN 1304-1) 
This application note discusses microstrip transmission line techniques that were evaluated using TDR measurements.

Notes d’application 2000-11-01

PDF PDF 349 KB
Langues 
Eye Characterization on Idle and Framed Data Traffic: the Bit Recovery Mode 
Traditionally, bit error rate testing compares the bits from a Device Under Test (DUT) against a reference data set, called the expected data. The user of Bit Error Ratio Tester (BERT) has to provide this expected data and load it into the tester.

Notes d’application 2005-09-21

PDF PDF 356 KB
Fast Total Jitter Test Solution 
This application note compares different total jitter measurement and extrapolation techniques to the Fast Total Jitter Measurement

Notes d’application 2005-08-29

PDF PDF 1.28 MB
Faster Risetime for TDR Measurements (PN 86100-4) 
This product note demonstrates how to make time domain reflection (TDR) measurements on electrical networks with better than 40 ps resolution.

Notes d’application 2001-07-01

PDF PDF 943 KB
Finding Sources of Jitter with Real-Time Jitter Analysis (AN 1448-2) 
This application note describes how to use a real-time oscilloscope with jitter analysis, along with the stimulus-response techniques, to meet the critical time-correlation requirement to relate jitter trend measurement results to measured signals.

Notes d’application 2003-06-30

PDF PDF 1.70 MB
Langues 
Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-P 
This document describes the requirements for forward clocking topology RX Jitter tolerance testing.

Notes d’application 2009-03-24

PDF PDF 606 KB
HDMI Sink and Source Compliance Test and Characterization 
In this product note examples are given for advanced, automated HDMI compliance tests and characterization based on a high bandwidth oscilloscope, a TMDS Signal Generator and the Test Automation Software Platform.

Notes d’application 2006-10-27

PDF PDF 431 KB
Langues 
High Precision Time Domain Reflectometry (AN 1304-7) 
Techniques for achieving the highest possible accuracy and resolution in signal integrity impedance measurements

Notes d’application 2003-10-27

PDF PDF 3.72 MB
Langues 
High-Precision TDR with the Agilent 86100 DCA & Picosecond Pulse Labs 4020 Source Enhancement Module 
Learn how to build a high-precision time-domain reflectometry/time-domain transmission measurement system.

Notes d’application 2003-09-12

PDF PDF 288 KB
How to characterize the Physical Layer of the Mobile Industry Processor Interface (MIPI D-PHY) 
How to characterize the Physical Layer of the Mobile Industry Processor Interface (MIPI D-PHY)

Notes d’application 2007-07-30

PDF PDF 611 KB
How to use the Agilent 81200 together with Agilent VEE 
This attached Product Note shows how to use the Agilent 81200 Data Generator/Analyzer together with Agilent VEE for Signal Integrity Analysis.

Notes d’application 2002-01-28

PDF PDF 383 KB
Improved Method for Characterizing and Modeling Gigabit Flex-Circuit Based Interconnects 
This paper describes sophisticated, time-domain methods of accurately predicting time- and frequency-domain high-speed signal characteristics.

Notes d’application 2005-09-08

PDF PDF 11.72 MB
Improving Usability and Performance in High-Bandwidth Active Oscilloscope Probes (AN 1419-02) 
Understand how to get minimal probe loading and highest-possible-performance representation of your signal.

Notes d’application 2002-11-01

PDF PDF 912 KB
Langues 
Integrated Debugging-A New Approach to Troubleshooting Your Designs with Real-Time Oscilloscopes 
Traditional debugging can be time consuming and inefficient. With Agilent Infiniium oscilloscopes, “integrated debugging” is a reality, and it leads you directly to the root cause of problems.

Notes d’application 2008-01-30

PDF PDF 1.17 MB
Langues 
Jitter Analysis Techniques for High Data Rates (AN 1432) 
This new application note describes the basic jitter measurements and the specific measurement techniques used in SONet/SDH/OTN and Gigabit Ethernet applications.

Notes d’application 2003-02-03

PDF PDF 4 MB
Langues 
Jitter Analysis: The Dual-Dirac Model, RJ/DJ, and Q-Scale 
This paper provides a complete description of the dual-Dirac model, how it is used in technology standards and a summary of how it is applied on different types of test equipment.

Notes d’application 2005-06-15

PDF PDF 515 KB
Jitter Fundamentals: Jitter Tolerance Testing with Agilent ParBERT 81250 
This applicaiton note describes gain fast and efficient insight into the operation and performance of CDR, clock system and jitter tolerance.

Notes d’application 2003-12-02

PDF PDF 3.18 MB

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