高速数字
在您的成功之路上,每一代数字标准的更改都带来新的风险。创建新产品并与像您这样的工程师协同工作时,我们对此深有体会。安捷伦用于进行高速数字测试的解决方案集是仪表和广泛专业技术(建立在我们不断与业界专家进行沟通交流的基础之上)的结合。通过分享我们最新的经验,安捷伦能够帮助您预测挑战和提高创建值得骄傲的产品的能力。安捷伦――实现您的最佳设计。
浏览完整的设计周期
通过浏览本网站,您将能了解到分别适用于设计周期全部四个阶段以及信号完整性分析核心部分的解决方案。
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示波器、分析仪、仪表
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提高高带宽示波器有源探头的可用性和性能
提高高带宽示波器有源探头的可用性和性能
应用说明 2003-06-05 |
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用物理层测试系统和先进设计系统
应用说明 2006-05-01 |
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6 Hints for Better SATA and SAS Measurements
These 6 Hints for better SATA and SAS measurements cover Tx, Rx, Impedance and Return Loss, and Host/Device Digital testing challenges.
应用说明 2012-02-02 |
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Characterization of Balanced Digital Components and Communication Paths
应用说明 2001-11-19 |
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Effective Reflection Characterization for Active Devices Using ENA Option TDR Application Note
This application note describes Hot TDR measurement, which is an effective characterization method for the reflection of transmitter and receiver.
应用说明 2012-01-12 |
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Limitations and Accuracies of Time and Frequency Domain Analysis of Physical Layer Devices
应用说明 2005-11-01 |
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Measurement Uncertainty of VNA based TDR/TDT Measurement Application Note
This application note explains the theory of measurement uncertainty in TDR/TDT measurement with the ENA Option TDR.
应用说明 2011-07-08 |
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Network Analysis - De-embedding and Embedding S-Parameter Networks (1364-1)
At RF and microwave frequencies, it becomes difficult to directly measure devices with nonstandard connectors (for example, devices using surface-mount packaging).
应用说明 2004-06-01 |
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S-Parameter Techniques for Faster, More Accurate Network Design (AN 95-1)
This Application Note is for information only. Agilent no longer sells or supports these products.
应用说明 1967-02-01 |
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Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, & 2-Port TDR
This Application Note focuses on part 1: those which use a single-port TDR, those which use TDR/TDT, and those which use 2-port TDR.
应用说明 2007-01-01 |
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Signal Integrity Analysis Series Part 2: 4-Port TDR/VNA/PLTS
This Application Note focuses on part 2: those which use a 4-port TDR/VNA/PLTS.
应用说明 2007-02-21 |
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Signal Integrity Analysis Series Part 3: The ABCs of De-Embedding
This Application Note focuses on Part 3: The ABCs of De-Embedding explaining different de-embedding techniques & shows how to minimize fixture effects for best results.
应用说明 2007-07-01 |
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