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High-Speed Digital

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In digital standards, every generational change puts new risks in your path. We see it firsthand when creating our products and working with engineers like you. Agilent’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of. Agilent - achieve your best design.

Navigate the entire design cycle

Explore this web site for solutions within all four stages of the design cycle as well as the crucial—and integral—field of signal integrity analysis.

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100G TX Designs - Tips & Techniques for Accurate Characterization Webcast 
Original broadcast on February 27, 2013

Webcast - recorded

 
Digital and Photonics Webcast Series 
Originally broadcast 2010, 2011. Access the recordings of many broadcasts

Webcast - recorded

 
DisplayPort 1.2 Physical Layer Testing 
Original broadcast October 30, 2012

Webcast - recorded

 
How to Solve DDR Signal Integrity Validation Challenges 
How to Solve DDR Signal Integrity Validation Challenges

Training Materials 2008-02-13

 
PCI Express(R) 3.0 Strategies for Transmitter and Receiver Validation 
Originally broadcast Feb 10, 2011

Webcast - recorded

 
SuperSpeed USB 3.0 Validation and Compliance Testing Challenges 
Originally broadcast May 18, 2011;

Webcast - recorded

 
Tips to Debugging DDR 1, 2 and 3 Physical and Protocol Layer Issues webcast 

Training Materials 2009-01-06

 
Understanding DDR4 AC Timing Parametrics Webcast 
Original broadcast March 20, 2013

Webcast - recorded

 
USB 3.0 Physical Layer Test Challenges: Gen3 and Beyond Webcast 
Live broadcast June 13, 2013; 10am Pacific / 1pm Eastern

Webcast