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High-Speed Digital
- Design & Simulation: Download the Quick Start Guide
- Analysis & Debug: Download the Debugging application note
- Compliance: Visit the compliance web page
- Signal Integrity: Link to the PLTS technical overview
In digital standards, every generational change puts new risks in your path. We see it firsthand when creating our products and working with engineers like you. Agilent’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of. Agilent - achieve your best design.
Navigate the entire design cycle
Explore this web site for solutions within all four stages of the design cycle as well as the crucial—and integral—field of signal integrity analysis.
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Test & Measurement events in Europe, Middle East & Africa
Test & Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.
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What on Earth is Jitter Amplification, and Why Should I Care Webcast
Original broadcast April 9, 2013
Webcast - recorded |
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Using IBIS AMI Models as ‘Executable Data sheets’ in High Speed Digital Interconnect Simulations
Originally broadcast Sept 9, 2010. Part of the Series: Signal Integrity for High Speed Digital Interconnects.
Webcast - recorded |
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Is Simulation a Requirement for Memory Designs Webcast
Live broadcast February 20, 2013; 10am Pacific / 1pm Eastern
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EMC 2013 - IEEE International Symposium on Electromagnetic Compatibility
August 5- 9, 2013; Denver, CO
Tradeshow |
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Modeling Optical Fiber Communication with Channel Simulation Webcast
Live broadcast March 6, 2013; 10am Pacific / 1pm Eastern
Webcast - recorded |
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Agilent Veranstaltungs-Webseite für Deutschland
Willkommen zur neuen Agilent Veranstaltungs-Webseite für Deutschland
Seminar |
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Ethernet Compliance Testing: Become More Green and Energy Efficient Webcast
Original broadcast March 20, 2013
Webcast - recorded |
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High-Sensitivity Current Measurements using an Oscilloscope Webcast
Original broadcast April 17, 2013
Webcast - recorded |
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