High-Speed Digital

In digital standards, every generational change puts new risks in your path. We see it firsthand when creating our products and working with engineers like you. Agilent’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of. Agilent - achieve your best design.

Navigate the entire design cycle

Explore this web site for solutions within all four stages of the design cycle as well as the crucial—and integral—field of signal integrity analysis.

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Oscilloscopes, Analyzers, Meters (38)
- Oscilloscopes (25)
- Spectrum Analyzers (Signal Analyzers) (4)
- Network Analyzers (8)
- Handheld Oscilloscopes, Analyzers, Meters (2)
- Logic Analyzers (4)
- Protocol Analyzers and Exercisers (4)
- EMI/EMC, Phase Noise, Physical Layer Test Systems (3)
- Bit Error Ratio Test (BERT) Solutions (10)
- Noise Figure Analyzers & Noise Sources (1)
- LCR Meters & Impedance Measurement Products (4)
- Digitizers (1)
Generators, Sources, Supplies (12)
- Signal Generators (Signal Sources) (1)
- Function / Arbitrary Waveform Generators (3)
- Pulse Generator Products (10)
- Data Generators & Analyzers (9)
Software (43)
- Agilent EEsof EDA Software (31)
- Application Software for Instruments (14)
PXI, AXIe, DAQ & Modular Solutions (7)
- PXI Products & Solutions (1)
- AXIe Products & Solutions (4)
- Data Acquisition Modules - DAQ (2)
- USB Products & Solutions (3)
Additional Test & Measurement Products (24)

1-25 of 86

100G TX Designs - Tips & Techniques for Accurate Characterization Webcast Original broadcast on February 27, 2013 Webcast - recorded
3D Electromagnetic Hands-On Workshop using EMPro Various dates and locations Seminar
Accelerating DDR4 Debug and Protocol Validation Webcast Original webcast February 26, 2013 Webcast - recorded
Accelerating USB 3.0 Protocol Development Original broadcast June 27, 2012 Webcast - recorded
ADMF: Facing the challenges of Super speed USB 3.0 Product Development Agilent Digital Measurement Forum (ADMF): Facing the challenges of Super speed USB Product Development Seminar Materials 2008-11-12	PDF 1.78 MB
Advanced Product Design & Test for High-Speed Digital Devices Webcast Original broadcast Jan 18, 2012 Webcast - recorded
Agilent EEsof EDA Training Course Calendar - 2013 Scheduled courses for the United States and Canada Classroom Training
Agilent EEsof EDA Workshop - HSD in ADS 2012 and SystemVue 2012.06 February 12, 13, 14, 2013; Westlake Village, Anaheim, La Jolla, CA Seminar
Agilent EEsof EDA Workshop Electronic System Design - Application based Workshop February 20 & 21, 2013; Anaheim & La Jolla, CA Seminar
Agilent EEsof EDA Workshop: What's New in Advanced Design System? February 12, 13, 14, 2013; Westlake Village, Anaheim, La Jolla, CA Seminar
All US and Canada Events - Trade Shows, Seminars, Webcasts Calendar of upcoming events Seminar
Analyzing Digital Jitter and its Component eSeminar FAQs FAQs from the eSeminar Seminar Materials 2006-05-11	PDF 35 KB
Application-focused Oscilloscope Measurements – Education Webcast Series Live broadcasts throughout 2013 Webcast
Astonishing Enhancements to Signal Integrity EDA Tools Using Video Game 3D Glasses and GPUs Originally broadcast Jan 21, 2010 Webcast - recorded
Breakthrough in High Speed Interconnect Analysis and Compliance Testing Originally broadcast April 27, 2011 Webcast - recorded
Building a Precision Jitter Source Presentation, June 1, 2004 From the Japan Agilent Digital Measurement Forum, this presentation reviews the construction of a precision jitter source for analyzing digital jitter measurements. Seminar Materials 2004-06-01	PDF 623 KB
Case Study: Overcoming Return-path Discontinuity in DDR3/GDDR5 Memory Controller Packages Original broadcast October 13, 2011 Webcast - recorded
Characterization and Modeling of a High Speed Backplane Differential Channels eSeminar FAQs FAQs from the eSeminar Seminar Materials 2006-05-11	PDF 80 KB
Characterize and Correct for Cable, Switch and Test Fixture Loss Using Only a High-Bandwidth Scope Originally broadcast July 27, 2011 Webcast - recorded
Combining the Power of RF & Microwave with High Speed Digital Seminar Materials Access the papers from the 2012 Seminar Seminar
Conquering USB 3.0 Physical Layer Test Challenges Original broadcast June 13, 2012 Webcast - recorded
Debugging and integrating MIPI DigRF enabled ICs in LTE and WiMAX mobile devices Original broadcast Oct 28, 2008. Webcast slides available for download only. Webcast - recorded
Design and Test Challenges in Next Generation High-Speed Serial Standards Attend this FREE education workshop at DesignCon 2012, brought to you by Agilent Technologies, Official Host Sponsor of the conference. Training Materials 2011-11-29
DesignCon 2011 CD of Agilent Education Forum Workshops and Presentations Order free CD of the 2011 Agilent Education Forum Workshops and Presentations Tradeshow
Digital and Photonics Webcast Series Originally broadcast 2010, 2011. Access the recordings of many broadcasts Webcast - recorded

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