Aerospace & Defense
- Radar: Download the radar application note
- Mil Comms: Download our SDR solution overview
- Satellites: Order our free reference poster
Focus where it counts
Missions evolve but one thing stays the same: the need to protect those who go in harm´s way. Success depends on a changing mix of people and technology ― and as technology becomes more complex, assuring readiness gets tougher.
Agilent is a source of assurance that your mission will succeed. Through our expertise in measurement science and test processes, we give you more time for the bigger issues: fulfilling today´s mission and managing the transition to what comes next. By helping you build greater assurance in system readiness, Agilent frees you to focus where it counts most.
See Measurement Solution Examples: Active Antenna Test, Multi-Emitter Environment Test Signals
Nouveautés
- Enabling Simulation and Test of Custom OFDM Signals
- Extending the Measurement Plane up to 1 km in Vector Network Analysis
- Understanding Phase Noise Needs and Choices in Signal Generation
- Using Agilent SystemVue to create realistic scenarios for radar and EW applications
- Radar, EW, ELINT Test Challenges article reprint
Affiner la liste
Par application
- Radar Test & Electronic Warfare (EW) Test (2)
- Military Communications (3)
- Satellites (1)
- Avionics, Guidance, Navigation & GPS (1)
Par type de contenu
- Bibliothèque
- Communiqués de presse
- Dossier de presse (12)
- Communiqués de presse
Par catégorie de produit
1-12 sur 12
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Agilent Introduces High-Performance Signal Analyzer for Advanced RF and Microwave Applications
Dossier de presse 2009-09-28 |
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Agilent Technologies Awarded $1.8 Million Contract by U.S. Navy for Handheld Spectrum Analyzers
Press Release
Dossier de presse 2011-01-23 |
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Agilent Technologies Introduces Its Highest-Resolution VME/VXS Digitizer for Defense Market
Dossier de presse 2009-10-20 |
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Agilent Technologies Introduces World's First 67-GHz Nonlinear Vector Network Analyzer
Using this hardware, designers can easily characterize and model components accurately up to frequencies of 67 GHz. In addition, X-parameters can be measured up to 67 GHz, providing an accurate model of linear and nonlinear component behavior at very high frequencies and wide bandwidth.
Dossier de presse 2011-10-17 |
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Agilent Technologies Named Oscilloscope Company of the Year
The award is based on Frost & Sullivan's recent analysis of the oscilloscope market.
Dossier de presse 2012-04-26 |
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Agilent Technologies to Demonstrate Connected SCA-Compliant Design Tools at SDR Forum 2009
Connectivity for Best-in-class SDR Design Flow Enabled by Collaboration with Zeligsoft, PrismTech
Dossier de presse 2009-12-01 |
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Agilent Technologies to Showcase Custom OFDM Waveform Design at 2010 Wireless Innovation Forum
Press release.
Dossier de presse 2010-12-01 |
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Agilent Technologies' SystemVue 2009.08 Unlocks RF-DSP Co-design, Custom Flow for Model-Based Design
Dossier de presse 2009-10-05 |
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Agilent Technologies' Wireless Test Tour Asia Begins June 24
Agilent: Your Partner in Advancing New Wireless Communications, focuses on the next generation of wireless technologies
Dossier de presse 2009-06-22 |
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Agilent Technologies’ Advanced Design System Selected by Comtech EF Data for Satellite Communication
...a clear-cut advantage compared to other tools we had evaluated,” said Tibi Artzi, unit manager with Comtech EF Data
Dossier de presse 2012-04-25 |
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New Geolocation Methods Using RF Sensor Networks
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Dossier de presse 2011-02-22 |
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New Level of Realism in Testing and Evaluation of Advanced Radar and Electronic-Warfare Systems
Dossier de presse 2011-07-27 |
