お問い合わせ窓口

航空宇宙／防衛

ご覧になるためには、ブラウザのJavascriptを有効にしてください。また、Adobe Flash Player が必要です。

Flash ダウンロード 

重要な場所に集中可能

ミッションは進化しますが、常に変わらないことが1つあります。すなわち、危険な状況にいる人々を保護する必要性です。成功は、作業に果たす人とテクノロジーに依存します。テクノロジーが複雑化しているため、用意ができたことを確認する作業はますます困難になっています。

Agilentは、ミッションの成功をサポートします。Agilentの測定やテスト・プロセスにおける専門知識を活用することで、お客様に、現在のミッションの達成、次に起こるイベントへの対処といったより大きな課題に取り組む時間的な余裕が生まれます。Agilentがシステムの準備作業を支援することにより、リソースを最も重要な場所に集中することが可能になります。

測定ソリューション例をご覧ください。アクティブ・アンテナ・テスト,Multi-Emitter Environment Test Signals

YouTubeビデオを見る 

最新情報

関連リンク

絞込み

絞込みのリセット

アプリケーション

コンテンツのタイプ

製品カテゴリ

126-150 / 153

並べ替え
Solving the Challenges of Solar Array Simulation 
Solving the Challenges of Solar Array Simulation defines the optimal power solution for satellite ground testing.

アプリケーション・ノート 2010-06-07

PDF PDF 264 KB
言語 
Sorting Signals Using Multiple Markers, Marker Tables and Peak Tables (PN 8590-6) 
This Product Note shows how marker and peak signal features are useful measurement aids in a spectrum display because they immediately locate a signal, and record its amplitude and frequency or time. The 8590 C/E/L-series Spectrum Analyzers offer two marker features and a peak sorting function to...

アプリケーション・ノート 2000-07-01

PDF PDF 377 KB
Spectrum Analysis: Amplitude and Frequency Modulation (AN 150-1) 
Modulation is the act of translating some low-frequency or base-band signal (voice, music, data) to a higher frequency. Why do we modulate signals? There are at least two reasons: to allow the simultaneous transmission of two or more baseband signals by translating them to different frequencies...

アプリケーション・ノート 2001-10-01

PDF PDF 1.23 MB
Spectrum and Signal Analyzer Measurements and Noise Application Note 1303 
Noise is the classical limitation of electronics. In this application note, the characteristics of noise and its direct measurement are discussed in detail.

アプリケーション・ノート 2012-05-04

PDF PDF 2.06 MB
言語 
Switching Solutions 
This paper discusses Agilent's complete line of switching solutions. Switch components are introduced, followed by the various scale of switch matrix that is required in RF and microwave testing.

アプリケーション・ノート 2010-11-18

PDF PDF 840 KB
言語 
System Developer Guide Using LAN in Test Systems - PC Configuration (AN 1465-11) - Application Note 
Using LAN in Test Systems: PC Configuration,the third note in the series, describes the additional capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10.

アプリケーション・ノート 2004-10-19

PDF PDF 204 KB
Techniques for Precise Cable and Antenna Measurements in the Field - Application Note 
This app note introduces measurement and calibration techniques for cable and antenna testing using FieldFox handheld analyzers.

アプリケーション・ノート 2012-08-30

 
Techniques for Precise Interference Measurements in the Field - Application Note 
This app note discusses the different types of interference in current and new systems and methods to measure a variety of interference types using spectrum analyzers such the FieldFox Series.

アプリケーション・ノート 2012-08-30

 
Techniques for Precise Measurement Calibrations in the Field - Application Note 
This app note discusses recent advances in VNA calibration and compares measurements made on a FieldFox analyzer using different calibration types for a variety of RF and microwave devices.

アプリケーション・ノート 2012-08-30

 
Techniques for Time Domain Measurements - Application Note  
This application note will introduce time domain and DTF measurement techniques for identifying the location and relative amplitudes of discontinuities while operating in the field.

アプリケーション・ノート 2013-03-05

 
Test-System Computer I/O Considerations (AN 1465-2) - Application Note 
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing

アプリケーション・ノート 2004-12-09

PDF PDF 189 KB
Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note 
This application note answers common questions about the use of drivers and direct I/O to send commands from a PC application to the test instrument.

アプリケーション・ノート 2004-12-21

PDF PDF 374 KB
The Real “Total Cost of Ownership” of Your Test Equipment 
This paper covers a TCO model for electronic T&M equipment and shows how operating costs can be critical drivers in reducing total cost of ownership beyond simply lowering acquisition (capital) costs.

アプリケーション・ノート 2010-09-30

PDF PDF 1.14 MB
言語 
Typical GPS Receiver Verification Tests Using a GPS Signal Simulator - Application Note  
This paper describes typical GPS receiver verification tests using a GPS signal simulator. The tests are used to verify functionality of embedded GPS receivers in mobile consumer products such as cell phones and other handheld receivers.

アプリケーション・ノート 2010-03-04

PDF PDF 355 KB
言語 
Understanding RF/Microwave Solid State Switches and their Applications 
This note explains FET, PIN diode and hybrid solid state switches. It discusses benefits/disadvantages of each type of switch, which specifications to consider and why, and gives application examples.

アプリケーション・ノート 2010-05-21

PDF PDF 1.07 MB
Understanding the Effects of Racking & System Interconnections (AN 1465-6) 

アプリケーション・ノート 2004-12-21

PDF PDF 235 KB
Using Agilent SystemVue to Create Realistic Scenarios for Radar and EW Applications  
Shows how the combination of software and hardware capabilities makes it possible to create dynamic and realistic scenarios for both component testing and scenario simulation for system test.

アプリケーション・ノート 2012-01-24

PDF PDF 3.01 MB
Using LAN in Test Systems - Network Configuration (AN 1465-10) - Application Note 
The decision to use LAN in a test system delivers important benefits to your company and your team. From a business perspective, intense competition among equipment vendors has produced a wide selection of high quality, low-cost solutions for local area networking

アプリケーション・ノート 2004-09-14

PDF PDF 182 KB
言語 
Using LAN in Test Systems - The Basics (AN 1465-9) - Application Note 
The basic purpose of any test system is to characterize and validate the performance of electronic components, assemblies or products. The complexity of this task depends on variables such as the physical nature of the device under test (DUT), the number of tests to be performed, the number of signals to be measured and the desired time per test.

アプリケーション・ノート 2004-07-29

PDF PDF 270 KB
Using LAN in Test Systems: Applications (1465-14) - Application Note and Example Programs 
Topics include balancing cost, convenience and security in three common LAN scenarios: sharing instruments, remote monitoring and data acquisition, and functional test systems. Includes downloadable example programs.

アプリケーション・ノート 2005-04-01

 
Using LAN in Test Systems: Setting up System I/O (AN 1465-15) - Application Note 
This set of application notes shows you how to simplify test system integration by utilizing open connectivity standards such as local area networking (LAN). The collective goal of these notes is to help you produce reliable results, meet your throughput requirements and stay within your budget.

アプリケーション・ノート 2005-03-29

PDF PDF 263 KB
Using MATLAB to Create Agilent Signal and Spectrum Analyzer Applications 
Learn to use MATLAB software to configure, control, and acquire data from X-Series signal and spectrum analyzers, and then use scripts to create, modify and execute custom analyzer applications.

アプリケーション・ノート 2009-09-03

PDF PDF 1.11 MB
Using SCPI and Direct I/O vs. Drivers (AN 1465-13) - Application Note 
Using SCPI and Direct I/O vs. Drivers, the fifth note in the series, outlines the relationship between input/output (I/O) software, application software and the ability to maximize instrument interchange and software reuse in present and future systems

アプリケーション・ノート 2004-12-13

PDF PDF 408 KB
Using SystemVue’s Radar Library to Generate Signals for Radar Design and Verification  
Agilent's Radar Library helps you with the productivity and accuracy of your radar signals.

アプリケーション・ノート 2011-01-25

PDF PDF 3.20 MB
言語 
Using USB in the Test and Measurement Environment (AN 1465-12) - Application Note 
Simplify test integration with USB interface. Whether you’re setting up an ad hoc system on a lab bench or designing a permanent solution for a manufacturing line, the three best choices today for connecting modern instrumentation to computers are GPIB, LAN, and USB.

アプリケーション・ノート 2004-11-19

PDF PDF 194 KB

前へ 1 2 3 4 5 6 7 次へ