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Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not 
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

Application Note 2008-10-15

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Effective Multitap Transformer Testing Using a Scanner (AN 1224-5) 
This Application Note shows an effective multi-tap transformer measurement using a scanner and the Agilent 4263B LCR Meter.

Application Note 2001-11-05

PDF PDF 945 KB
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How to use the Agilent N6700 Modular Power System to replace an Agilent 662xA (AN 1467)  
This is a high-level overview to help current 662xA owners easily convert to an Agilent N6700.

Application Note 2004-08-02

PDF PDF 220 KB
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Increase Automotive ECU Test Throughput (AN 1505) 

Application Note 2004-10-22

PDF PDF 58 KB
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Increase DC-input Battery Adapter Test Throughput by Several-fold (AN 1506) 

Application Note 2004-10-22

PDF PDF 80 KB
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Innovative Power Supplies Save Rack Space 
In the past, many programmable system DC power supplies in the medium power range (500W to 2kW) have been packaged in 2U-high (2-EIA rack units) and even 3U, full rack width chassis...

Application Note 2004-12-16

 
N6700 Modular Power System: Determining Specifications when Paralleling Outputs (AN 1560) 

Application Note 2005-07-27

PDF PDF 110 KB
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PNA Automation - Connectivity Advances for Component Manufacturers 
LAN-enabled instruments are launching a new era in test and measurement. The ability to integrate test instrumentation with IT infrastructure is having a profound effect on how data is acquired and used in a modern facility.

Application Note 2000-10-03

PDF PDF 174 KB
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Replacing the Agilent 34401A with the New 34410A/34411A High Performance Digital Multimeters 
This application note provides a high level overview of the differences between the Agilent 34401A 6 1/2 Digit Digital Multimeter and the new Agilent 34410A and 34411A 6 1/2 Digit High Performance DMMs.

Application Note 2005-11-15

PDF PDF 298 KB
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Simplify Multiple Bias Voltage Sequencing and Ramping for PC Motherboard Test (AN 1504) 

Application Note 2004-10-22

PDF PDF 57 KB
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Testing Uninterruptible Power Supplies Using Agilent 6800 Series ac Power Source/Analyzers 
This Product Note describes how Agilent ac sources can be used to help test uninterruptible power supplies in many different environments, including research and development, manufacturing, and incoming inspection.

Application Note 2001-01-16

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Using LXI to Boost Throughput in Semiconductor Manufacturing 
This document is a case study that discusses the successful customer implementation of an Agilent LXI solution for a multinational semiconductor manufacturer

Application Note 2007-04-25

PDF PDF 234 KB