制造与生产测试

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5 Hz - 3 GHz矢量网络分析仪上的新的阻抗测量解决方案及应用 Originally broadcast April 19, 2011 网上直播 -- 已存档的
Apex Expo 2012 展览会 Feb 28 - Mar 1, 2012; San Diego, CA 展览会
PXI 多厂商互操作性的重要性和价值 Live broadcast March 28, 2012 10am PT 网上直播
PXI 自动测试系统整合的首要考虑因素 Live broadcast Apr 24, 2012 10am PT 网上直播
PXI 自动测试系统整合的首要考虑因素 Live broadcast Apr 24, 2012 10am PT 网上直播
PXI、AXIe、DAQ 和模块化解决方案网络研讨会系列 Live broadcasts various dates in 2012 网上直播
“EDA 的创新”网络研讨会：使用人工神经网络（ANN）进行基于测量的 FET 建模 Live broadcast Feb 2, 2012; 10AM Pacific / 1PM Eastern 网上直播
“优化 PXI 模块化功能测试系统吞吐量”网络研讨会 Originally broadcast April 27, 2011 网上直播 -- 已存档的
使用最新版本 Agilent IC-CAP WaferPro 自动进行晶圆上测量 Originally broadcast Jan 27, 2011 网上直播 -- 已存档的
使用矢量网络分析仪进行射频放大器测试的基础知识 Live broadcast Mar 13, 2012; 10am Pacific / 1pm Eastern 网上直播
参数测试基础培训：第 1 部分 Originally broadcast Sept 15, 2010 网上直播 -- 已存档的
实现出色测量的数字转换器设计基础 Live broadcast Mar 21, 2012; 10am Pacific / 1pm Eastern 网上直播
提升模块化仪器性能的网络研讨会 Originally broadcast Oct 13, 2010 网上直播 -- 已存档的
设置 IC-CAP WaferPro，以便进行晶圆上测量 originally broadcast June 22, 2011 网上直播 -- 已存档的
高速数字器件的先进产品设计和测试，网上研讨会 Original broadcast Jan 18, 2012 网上直播 -- 已存档的
3070 Family Test Development Process Learn to develop a board test program with the Agilent 3070 Family board test system. 课堂培训
3070 Family WIN System Administration Learn to successfully perform the tasks required of an Agilent 3070 Windows 2000 System Administrator. Understand the file system concepts and start-up/shutdown procedures. Discover the tools available to the system administrator. 课堂培训
5DX Image Interpretation Training Interpreting X-ray images and defect calls can be tricky, especially for operators who are new to automated X-ray inspection (AXI) technology. 课堂培训
5DX Operator Training The Agilent 5DX is one of the most advanced test systems on the planet. Here's where you'll get the baseline skills you need to use it productively. 课堂培训
Accelerating DDR4 Debug and Protocol Validation Webcast Original webcast February 26, 2013 网上直播 -- 已存档的
Advanced Passive Intermodulation Modulation (PIM) Measurement System Webcast Live broadcast August 29, 2013; 7am PT/10am ET/16:00 CET 网上直播
Advanced Product Design & Test for High-Speed Digital Devices Webcast Original broadcast Jan 18, 2012 网上直播 -- 已存档的
Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro Originally broadcast Jan 27, 2011 网上直播 -- 已存档的
Basics of RF Amplifier Test With the Vector Network Analyzer Original broadcast Mar 13, 2012 网上直播 -- 已存档的
Boundary Scan Test Methods for DDR Memories Originally broadcast May 18, 2010 网上直播 -- 已存档的

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