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Manufacturing & Production Test

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3070 Boundary Scan 
Learn concepts of Boundary-Scan technology. TAP (test access port), the functionality of registers (BYPASS, boundary, IDCODE), and the structure of the "boundary-cell" are described.

Classroom Training

 
3070 Family Maintenance Fundamentals 
Gain an understanding of the Agilent 3070 service documentation, Confirmation and Diagnostics, System level card operation, power, analog, digital, and control subsystem operation and troubleshooting.

Classroom Training

 
3070 Family Test Development Process 
Learn to develop a board test program with the Agilent 3070 Family board test system.

Classroom Training

 
3070 Family WIN System Administration 
Learn to successfully perform the tasks required of an Agilent 3070 Windows 2000 System Administrator. Understand the file system concepts and start-up/shutdown procedures. Discover the tools available to the system administrator.

Classroom Training

 
4080 User Training 
Learn Agilent 4080 hardware and software concepts.

Classroom Training

 
5DX Cooperative Maintenance Training, Part 2 
Troubleshooting and repairing an Agilent 5DX in-house gets you back in production fast.

Classroom Training

 
5DX Image Interpretation Training 
Interpreting X-ray images and defect calls can be tricky, especially for operators who are new to automated X-ray inspection (AXI) technology.

Classroom Training

 
5DX Introduction to Maintenance / Operator Training 
This 5 day course covers operation of the 5DX, basic confirmation, adjustment and repair.

Classroom Training

 
5DX Operator Training 
The Agilent 5DX is one of the most advanced test systems on the planet. Here's where you'll get the baseline skills you need to use it productively.

Classroom Training

 
Accelerating DDR4 Debug and Protocol Validation Webcast 
Original webcast February 26, 2013

Webcast - recorded

 
Advanced Product Design & Test for High-Speed Digital Devices Webcast 
Original broadcast Jan 18, 2012

Webcast - recorded

 
AOI Family User Maintenance Training 
Gain an understanding of the hardware components that make up an AOI system. Learn to maintain and repair your Agilent AOI system.

Classroom Training

 
Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro 
Originally broadcast Jan 27, 2011

Webcast - recorded

 
Basics of RF Amplifier Test With the Vector Network Analyzer 
Original broadcast Mar 13, 2012

Webcast - recorded

 
Boundary Scan Test Methods for DDR Memories 
Originally broadcast May 18, 2010

Webcast - recorded

 
Digitizer Design Fundamentals for Superior Measurements 
Original broadcast Mar 21, 2012

Webcast - recorded

 
Driving Down Test Cost, Schedule & Risk with Smart Switching 
Original broadcast May 30, 2012

Webcast - recorded

 
Effective Crosstalk Characterization Webcast 
Original broadcast January 24, 2013

Webcast - recorded

 
i3070 Family Advanced Digital Training 
Become proficient at digital testing techniques on the Agilent 3070 family combinational board test systems. Create custom digital tests including X-Tree, FlashRAM, In-System Programmed Complex Programmable Logic Devices...

Classroom Training

 
i5000 Sustaining Engineer 

Classroom Training

 
In-circuit Test - Archived Event and Seminar Material 

Webcast - recorded

 
Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs) 
Original broadcast Feb 2, 2012

Webcast - recorded

 
Learn about the latest i3070 ICT productivity tools from us, DeMille Research, and Derby Associates 
Originally broadcast Aug 24, 2010

Webcast - recorded

 
Manufacturing Test Software Solutions - Archived Event and Seminar Material 

Webcast - recorded

 
Medalist 3070 - Archived Event and Seminar Material 

Webcast - recorded

 

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