阻抗
阻抗测量不仅在无源元器件领域具有举足轻重的作用，在材料、电源等领域也非常重要。很多物理参数，例如电容（C）、电感（L）和电阻（R）都是以阻抗为基础进行测量。此外，材料参数（电容率：ε，导磁率：μ）也可通过阻抗测量导出。安捷伦具有全套的阻抗测试设备和测试附件，可帮助您完成测量。选择安捷伦的阻抗测量产品，您不仅可获得精确、可靠的测试结果，还能获得更多益处。
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Evaluation of MOS Capacitor Gate Oxide C-V Characteristics Using the Agilent 4294A(PN4294-3)
As a result of extremely high integration of logic LSIs, MOS FETs with gate lengths of 0.1 mm or less have been produced recently. A consequence of this miniaturization has been the need for very thin gate oxide layers.
应用说明 2003-06-26 |
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Impedance Measurement Handbook
Impedance measurements basics using Agilent Technologies' LCR meters and impedance analysers.
应用说明 2009-06-17 |
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Multifrequency C-V Measurements of Semiconductors (AN 369-5)
The Agilent 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.
应用说明 2008-12-10 |
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