Impedance measurement is important not only in passive components industry but also various industries such as materials, power supply, and so on. Physical parameters like capacitance (C), inductance (L) and resistance (R) are measured based on the impedance. Also, material parameters (permittivity: ε, permeability: μ) can be derived through impedance measurements. Agilent has a complete line of impedance test equipment and test accessories to help your measurement. When you choose an impedance measurement product from Agilent, you get more than accurate and reliable test results.
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Evaluation of MOS Capacitor Gate Oxide C-V Characteristics Using the Agilent 4294A(PN4294-3)
As a result of extremely high integration of logic LSIs, MOS FETs with gate lengths of 0.1 mm or less have been produced recently. A consequence of this miniaturization has been the need for very thin gate oxide layers.
Application Note 2003-06-26
Impedance Measurement Handbook
Impedance measurements basics using Agilent Technologies' LCR meters and impedance analysers.
Application Note 2009-06-17
Multifrequency C-V Measurements of Semiconductors (AN 369-5)
The Agilent 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.
Application Note 2008-12-10