Printed Circuit Board Test
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1-5 of 5
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Evaluating Microstrip with Time Domain Reflectometry (AN 1304-1)
This application note discusses microstrip transmission line techniques that were evaluated using TDR measurements.
Application Note 2000-11-01 |
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High Precision Time Domain Reflectometry (AN 1304-7)
Techniques for achieving the highest possible accuracy and resolution in signal integrity impedance measurements
Application Note 2003-10-27 |
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High-Precision TDR with the Agilent 86100 DCA & Picosecond Pulse Labs 4020 Source Enhancement Module
Learn how to build a high-precision time-domain reflectometry/time-domain transmission measurement system.
Application Note 2003-09-12 |
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Measuring Characteristic Impedance of Short Rambus Motherboard Traces (AN 1304-4)
This application note tells you how to perform characteristic impedance measurements on Rambus motherboards and SO-RIMM's using TDR with normalization and verification.
Application Note 2000-11-01 |
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Time Domain Reflectometry Theory (AN 1304-2)
This application note discusses the fundamentals of TDR and then relates these fundamentals to the parameters that can be measured in actual test situations.
Application Note 2002-08-29 |
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