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可進行有效預測的測試範圍工具網路影片 – 讓您快速確認潛在的測試範圍與策略
原始播放時間為 2010 年 10 月 20 日
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執行測試時如何避免出現狀態中斷問題
Originally broadcast Dec 9, 2010
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探索高效能即時示波器的未來趨勢
現場直播：2012 年 4 月 11 日； 10am （美西時間） / 1pm （美東時間）
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100G TX Designs - Tips & Techniques for Accurate Characterization Webcast
Original broadcast on February 27, 2013
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3070 Family Test Development Process
Learn to develop a board test program with the Agilent 3070 Family board test system.
教室教育訓練 |
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3070 Family WIN System Administration
Learn to successfully perform the tasks required of an Agilent 3070 Windows 2000 System Administrator. Understand the file system concepts and start-up/shutdown procedures. Discover the tools available to the system administrator.
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5DX Image Interpretation Training
Interpreting X-ray images and defect calls can be tricky, especially for operators who are new to automated X-ray inspection (AXI) technology.
教室教育訓練 |
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5DX Operator Training
The Agilent 5DX is one of the most advanced test systems on the planet. Here's where you'll get the baseline skills you need to use it productively.
教室教育訓練 |
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Advanced Product Design & Test for High-Speed Digital Devices Webcast
Original broadcast Jan 18, 2012
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Agilent 3070 Board Test Double Feature Webcast
Originally broadcast Feb 24, 2011
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Agilent Board Test User Group Meeting 2013 – Cleveland, OH
Cleveland, OH - May 15 & 16, 2013
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Application-focused Oscilloscope Measurements – Education Webcast Series
Live broadcasts throughout 2013
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Assembled PCB Inspection: SJ Family - Archived Event and Seminar Material
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Boundary Scan Online Training
Get up to speed on boundary scan! Access online training materials for boundary scan from the comfort of your desk!
訓練教材 2010-01-28 |
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Boundary Scan Test Methods for DDR Memories
Originally broadcast May 18, 2010
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Boundary Scan Test Methods for DDR Memories
In-circuit testing of DDR Memories has become increasingly difficult. This webcast discusses methods of DDR test development and debug.
訓練教材 2011-03-28 |
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Breakthrough in High Speed Interconnect Analysis and Compliance Testing
Originally broadcast April 27, 2011
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DfT rules for boundary scan during ICT
Learn about the design for test rules for boundary scan used at in-circuit test, that can help you create a good test, minimizing the time and effort needed for debugging while maximizing the efficiency of your test.
訓練教材 2009-12-01 |
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Digitizer Design Fundamentals for Superior Measurements
Original broadcast Mar 21, 2012
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Discrete Oscillator Design Tools and Techniques
Originally broadcast Sept. 16, 2010
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EMC 2013 - IEEE International Symposium on Electromagnetic Compatibility
August 5- 9, 2013; Denver, CO
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Ethernet Compliance Testing: Become More Green and Energy Efficient Webcast
Original broadcast March 20, 2013
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High-Sensitivity Current Measurements using an Oscilloscope Webcast
Original broadcast April 17, 2013
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i5000 Sustaining Engineer
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Improving PCB Test Coverage with Agilent’s i3070 Cover-Extend Technology
Original broadcast Sept 29, 2011
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