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Instrument Operating Systems & Software

Browse our library of application notes here for helpful information about instrument operating systems and software.

You'll find both current and legacy application notes.

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51-65 of 65

Understanding and Configuring the 5DX Selftest and Black/White Level Tests This paper discusses the theory and practice of 5DX automatic compensation tools, Selftest and gray level correction. Application Note 2004-12-01	PDF 158 KB
Understanding the PCAP Polarity Reject Signal This paper describes the algorithm used to determine if polarized capacitors are properly oriented. Application Note 2004-12-02	PDF 1.09 MB
UNIX vs. Windows Differences for 3070 Users This documentation serves as a PC transition guide to help existing 3070 customers migrate from the Unix platform to the PC platform. Application Note 2002-09-19
Use of the Test Results Command Processor TRCMDPRO processes the results from the Agilent 5DX in a way that is specified by a command file. This file is TRCMDPRO.CMD. In addition to the software revisions named, the document applies to all 5DX software versions. Application Note 1998-01-12	PDF 20 KB
Use of Wrong Thickness Technique Gives Bad Test Results Beginning with release 6.0, there are two techniques for measurement of solder thickness on the Agilent 5DX, each based on use of a different Confirmation & Adjustment panel. Application Note 2000-12-31
Using Extended Calibration Software for Wide Bandwidth Measurements (AN 1443) This 16-page application note explains how to ensure accurate measurements with a vector signal analyzer using quick calibration methods. Application Note 2008-05-22	PDF 1.19 MB Languages English \| 2008-05-22 \| PDF 1.19 MB 日本語 \| 2003-04-14 \| PDF 495 KB
Using NDFCOL.EXE, the NDF "Line Up the Columns" Utility NDFCOL.EXE is a handy little utility that will form neat columns of data in NDF files. Application Note 2002-06-06
Using Pop-up Windows There are occasions where the use of a pop-up window would be advantageous while testing boards on the Agilent 3070. This article is meant to highlight one method that can be used to obtain that end. Application Note 1996-01-01	PDF 18 KB
Using the Auto Optimizer on the Agilent Medalist In-Circuit Test Systems Learn how to optimize throughput by using the auto optimizer tool. Application Note 2008-05-03	PDF 237 KB
Using the Graphical Pin Locator on Agilent Medalist In-Circuit Test Systems Enhancing productivity is the end result when the graphical version of "find pins" is utilized. This tool is called pin locator and is part of the Operator GUI Browser in version 7.0. Application Note 2008-05-03	PDF 203 KB
Using the VISA COM I/O API in .NET - Application Note The Microsoft .NET architecture has many features that make it an excellent environment for Test & Measurement programmers. VISA COM I/O is an update of the older VISA C API to work in and with COM technology. Application Note 2007-03-16	PDF 345 KB
Version 7.x ASAP Best Practices In an effort to standardize programming practices for the Agilent 5DX, Agilent has created a set of procedures representing 5DX "best practices" that address various aspects of the programming process. Application Note 2001-07-25
Windows & Unix Feature Comparison The Windows & Unix 3070 Feature Comparison document provides a detailed listing of features translated to the Windows based 3070 from the Unix based 3070. Application Note 2002-07-31	PDF 71 KB
Writing Control Software for the Agilent (PN 83236A/B) The 83236A/B is a frequency translator and power meter that is intended to be used with an 8920A/B, 8921B, or 8924C Test Set for testing PCS mobiles and base stations. This Product Note is written to help programmers understand the concepts and algorithms necessary for programming the... Application Note 1996-12-01	PDF 105 KB
Writing Flash Memory with Agilent 3070 Systems Flash memory is traditionally programmed on PROM programmers, but some manufacturers report a one percent damage rate due to the extra handling steps required! Application Note 2001-05-18	PDF 31 KB