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Instrument Operating Systems & Software

Browse our library of application notes here for helpful information about instrument operating systems and software.

You'll find both current and legacy application notes.

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3070 In System Programming (ISP) Family 
On Board Programming, Bottom Line Benefits

Application Note 2002-07-25

PDF PDF 200 KB
3070 Increasing Throughput 
There are decisions one can make that causes an Agilent 3070 test program to be slower or faster than what Test Consultant generates automatically. This paper offers many tips about how to optimize your system's performance.

Application Note 1997-03-03

PDF PDF 41 KB
3070 Series 3 Flash70 Programming Guide 
This guide contains information about the procedures, tasks, and syntax required to perform flash programming with HP 3070 test systems.

Application Note 2001-09-12

PDF PDF 1.85 MB
A Software Algorithm for Implementing Automatic Power Ranging in the 8960 Series 10 Wireless... 
This Product Note presents a software algorithm for performing automatic power ranging in the Agilent 8960 Series 10 wireless communications test set with the Agilent E1960A GSM mobile test application installed. Agilent E1960A GSM mobile test application revisions, up to and including, A.01.04...

Application Note 1999-04-01

PDF PDF 311 KB
Applications and Operations of the 8970A Noise Figure Meter (PN8970A-1) 
Part Number: 08970-99000 (Nov81). The 8970A is a discontinued product; this product note is provided for information only.

Application Note 1981-11-01

PDF PDF 7.65 MB
CDPD MDBS Cell Site Test Software Troubleshooting 
This Product Note is a troubleshooting guide designed to answer the most problematic and typical questions that occur when testing a CDPD MDBS with the Agilent Technologies 8921A CDPD test solution. General situations Data collection does not work A parameter you changed does not...

Application Note 1997-06-01

PDF PDF 102 KB
Choosing Your Test System Software Architecture (AN 1465-4) 

Application Note 2004-12-21

PDF PDF 409 KB
Languages 
Considerations for Surface Map Setup 
The concept of delta-Zs is perhaps the most difficult thing to understand about the surface map process.

Application Note 2006-08-08

 
Dealing with Board Thickness Variations 
The Agilent 5DX has the capability to be implemented such that it can accommodate thickness variations on a board-by-board basis. NOTE: Content described is in the 5DX Reference Guide but is no longer in Chapter 7 as mentioned herein.

Application Note 2001-05-16

PDF PDF 31 KB
Design for Testability - Test for Designability 
This paper addresses testability considerations, both physical and logical, and focuses on both the new constraints and the new freedoms of modern manufacturing test in the ever-changing challenge.

Application Note 2003-01-28

PDF PDF 852 KB
Enhanced Log Records for the Agilent Medalist In-Circuit Test System 
Track changes made to your i3070 test programs to improve success.

Application Note 2009-03-04

PDF PDF 801 KB
Extending the 8640B Frequency Down to DC (AN 171-2) 
Measurements with Signal Generators Application Note 171-2

Application Note 1974-09-01

PDF PDF 644 KB
How To Float, or Series, Agilent 3070 DUT Supplies 
The Agilent 3070 development software does an amazing job of calculating the wiring needed to build fixtures. Even so there are occasionally cases which require wiring that the standard Agilent 3070 software can not handle.

Application Note 1997-01-23

PDF PDF 34 KB
In-circuit Testing of Low Voltage Devices 
Core technical document summarizing issues regarding the testing of low voltage devices on the 3070 and i5000, including updated Safeguard information.

Application Note 2005-05-25

PDF PDF 172 KB
In-System Programming on the Agilent 3070 
In-System Programmable devices are more widely used on today's boards to provide flexibility to design engineers and to reduce the cost of a product.

Application Note 2001-07-02

PDF PDF 205 KB
Learned Data for the 5DX 
The Agilent 5DX uses learned data in several ways to improve algorithm performance. There are basically 2 different forms of learned data.

Application Note 2000-11-01

 
NDF and RTF - Hashed Names 
There have been many questions about hashed directory names. This is a brief explanation of why they are, and how they are generated.

Application Note 1998-06-30

 
Obtaining a Listing of Applications on Series II Systems 
There is currently no easy way to obtain a list of all resident applications on a 5DX System or TDW. It is difficult to match panel name with hash name and see when the application was last updated.

Application Note 2002-06-01

 
PLD Programming on the Agilent 3070 Using the PLD ISP Product 
In-System Programmable PLDs are more widely used on today's boards to provide flexibility to design engineers and to reduce the cost of a product.

Application Note 2002-02-26

PDF PDF 242 KB
Preparing a .cc File for Export to Test Link 
This procedure describes the process of converting ECAD data into a form that can be used by Test Link.

Application Note 2002-10-16

PDF PDF 70 KB
Printed Circuit Board Split-Pad Test Method and Design 
This application note describes the split-pad concept for use with a bed of nails style test fixture.

Application Note 1999-06-01

PDF PDF 50 KB
Procedure to backup ITF3.1.1 Database and DataStore and Restore Them in a New ITF Server with SQL200 
This document is targeted at users who are archiving historical data or migrating to a more powerful server utilized to run Agilent’s ITF.

Application Note 2008-07-28

PDF PDF 512 KB
Reducing Load Time for Loaderless Systems 
For Series 2L systems, it may be possible to reduce the time it takes to load a panel.

Application Note 1999-12-01

 
Reducing Process Defect Escapes with Vectorless Test 
Process defects that escape in-circuit test lead at best to increased repair costs, and at worst to a "bone pile1" problem.

Application Note 2001-05-17

PDF PDF 512 KB
Remote Network Connections Creation for the Operator Logon 
Operator logon on the Agilent 5DX Series II System is limited, in that it does not allow Operator to make network connections that are required for sending images and res files to the PLR workstation.

Application Note 2002-06-30

 

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