设备操作系统和软件
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In-System Programming on the Agilent 3070
In-System Programmable devices are more widely used on today's boards to provide flexibility to design engineers and to reduce the cost of a product.
应用说明 2001-07-02 |
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205 KB
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Learned Data for the 5DX
The Agilent 5DX uses learned data in several ways to improve algorithm performance. There are basically 2 different forms of learned data.
应用说明 2000-11-01 |
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NDF and RTF - Hashed Names
There have been many questions about hashed directory names. This is a brief explanation of why they are, and how they are generated.
应用说明 1998-06-30 |
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New Features in Version 5.0 Software for 3070
Typically, when Agilent's Manufacturing Test Division introduces a new software revision for its flagship 3070 In-Circuit Tester, it only communicates with customers about the major new features.
应用说明 2003-01-28 |
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84 KB
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Non-Volatile Memory Programming on the Agilent 3070
The trend in non-volatile memory, like the general trend in electronic products, is to increase capability, reduce size, reduce cost, and get the final product to market faster than the competition.
应用说明 2003-05-29 |
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28 KB
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Obtaining a Listing of Applications on Series II Systems
There is currently no easy way to obtain a list of all resident applications on a 5DX System or TDW. It is difficult to match panel name with hash name and see when the application was last updated.
应用说明 2002-06-01 |
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PLD Programming on the Agilent 3070 Using the PLD ISP Product
In-System Programmable PLDs are more widely used on today's boards to provide flexibility to design engineers and to reduce the cost of a product.
应用说明 2002-02-26 |
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242 KB
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PNA Automation - Software Application Development (1408-13)
应用说明 2004-09-13 |
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961 KB
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Preparing a .cc File for Export to Test Link
This procedure describes the process of converting ECAD data into a form that can be used by Test Link.
应用说明 2002-10-16 |
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70 KB
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Printed Circuit Board Split-Pad Test Method and Design
This application note describes the split-pad concept for use with a bed of nails style test fixture.
应用说明 1999-06-01 |
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50 KB
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Problem with Subtype Learning When Used with the Connector Algorithm in R7.0
5DX Technical Paper - Problem with Subtype Learning When Used with the Connector Algorithm in R7.0
应用说明 2004-02-20 |
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16 KB
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Procedure to backup ITF3.1.1 Database and DataStore and Restore Them in a New ITF Server with SQL200
This document is targeted at users who are archiving historical data or migrating to a more powerful server utilized to run Agilent’s ITF.
应用说明 2008-07-28 |
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512 KB
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Reducing Load Time for Loaderless Systems
For Series 2L systems, it may be possible to reduce the time it takes to load a panel.
应用说明 1999-12-01 |
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Reducing Process Defect Escapes with Vectorless Test
Process defects that escape in-circuit test lead at best to increased repair costs, and at worst to a "bone pile1" problem.
应用说明 2001-05-17 |
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512 KB
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Remote Network Connections Creation for the Operator Logon
Operator logon on the Agilent 5DX Series II System is limited, in that it does not allow Operator to make network connections that are required for sending images and res files to the PLR workstation.
应用说明 2002-06-30 |
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Rotating Boards on a Panel
Rotating Boards on a Panel if often necessary. In addition to the software revisions named within, the explained technique in the document is utilized for for 4.x, 5.x, 6.x and 7.x. For 8.x Test Link deals with this automatically.
应用说明 2001-05-17 |
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40 KB
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Sampling on the Agilent 5DX
Sampling Mode allows test coverage to be optimized with line speed. This document explore the setup procedure for the Agilent 5DX for sampling.
应用说明 2002-05-08 |
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SEMI S2 Standard Modifications for Agilent 3070 and Related Equipment
This document describes three items pertaining to the Agilent 3070 and the SEMI S2 standard. Each of them is related to a variance with the SEMI standard.
应用说明 2006-06-15 |
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52 KB
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Synchronizing 3070 System Clocks
These instructions are for synchronizing the system clocks of several network-connected UX workstations in the absence of an existing timeserver.
应用说明 2001-09-27 |
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66 KB
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System Issues in Boundary-Scan Board Test
While Boundary-Scan is a powerful test tool, test engineers are finding out that yesterday's DFT rules and test approaches may actually be detrimental to successfully testing systems on a board.
应用说明 2003-01-28 |
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37 KB
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Testing FPGullwing Misalignment Across the Pad
A technique is described which enables detection of misalignment of gullwing joints across the joint using duplicate components and FPGullwing Misalignment.
应用说明 2004-12-08 |
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1.58 MB
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Testing Transformers on Unpowered Systems
This paper explains how to test basic analog parts, using unpowered systems.
应用说明 2003-03-21 |
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10 KB
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The Life of a 5DX Inspection C# File
The {Hashed Panel Name}.C# file is basically cad information about a panel program. It is used in conjunction with various utilities to overlay cad data on images or provide cad data for filters.
应用说明 2001-10-16 |
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97 KB
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Troubleshooting Medalist Intelligent Test Framework Port Problems
This document serves as a guide/reference to do preliminary analysis and troubleshooting when network/communication problems occur with the ITF server of the tester agent.
应用说明 2008-05-22 |
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813 KB
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Tying a Power Supply to Multiple Boards in a Panel
If you have a situation with multiple boards on a panel, and you need to wire one or more power supplies to each board, you often can wind up with problems wiring power and ground. Usually, you'll see warnings of the type FXT66.
应用说明 2001-06-12 |
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16 KB
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