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儀器作業系統與軟體

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Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro 
Originally broadcast Jan 27, 2011

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Digitizer Design Fundamentals for Superior Measurements 
Original broadcast Mar 21, 2012

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Driving Down Test Cost, Schedule & Risk with Smart Switching 
Original broadcast May 30, 2012

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PXI, AXIe, DAQ and Modular Solutions Webcast Series 
Live and on-demand webcasts, various dates in 2012

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The Importance and Value of PXI Multi-Vendor Interoperability 
Original broadcast March 28, 2012

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Tools and Tips for Ensuring Reliable Sensor Measurements and Logging Systems 
Original broadcast Mar 20, 2012

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Top Considerations to Integrating a PXI Automated Test System 
Original broadcast Apr 24, 2012

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