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Network Analysis - In-Fixture Measurements (1287-9) 

Application Note 2006-01-10

PDF PDF 920 KB
Langues 
Network Analysis - Mixers - Characterize Frequency-Translating Devices (AN 1287-7) 
This Application Note explores current test equipment solutions and techniques that can be used to accurately characterize and test frequency-translating devices.

Application Note 2000-03-01

PDF PDF 529 KB
Langues 
Network Analysis Basics - 10 Hints for Making Better Network Analyzer Measurements (AN 1291-1B) 
This Application Note contains hints to help you understand and improve your use of network analyzers, and a summary of network analyzers and their capabilities.

Application Note 2001-09-17

PDF PDF 328 KB
Langues 
Network Analysis Basics - Applying Error Correction To Network Analyzer Measurements (AN 1287-3) 
Only perfect test equipment would not need correction. Imperfections exist in even the finest test equipment and cause less than ideal measurement results.

Application Note 2002-03-27

PDF PDF 168 KB
Langues 
Network Analysis Basics - Architecture Of Network Analyzers (AN 1287-2) 
This Application Note explains that Network analyzers have become one of the most important tools for characterizing the performance of high-frequency components and devices.

Application Note 2000-12-06

PDF PDF 1.42 MB
Langues 
Network Analysis Basics - Understanding and Improving Dynamic Range (1363-1) 
This Application Note explains that achieving the highest possible network analyzer dynamic range is extremely important when characterizing many types of microwave devices, and in some cases the key factor in determining measurement performance.

Application Note 2001-11-01

PDF PDF 183 KB
Langues 
Network Analysis Solutions Advanced Filter Tuning Using Time Domain Transforms (AN 1287-10) 
Tuning multi-stage, coupled-resonator band-pass filters is difficult due to interactions between resonator and coupling tuning. To achieve the proper pass-band response and to get low return loss you must precisely tune the frequency of each resonator and precisely set each coupling between the...

Application Note 2003-05-25

PDF PDF
Langues 
Network Analyzer Basics 
This 94-page note covers the principles of measuring high-frequency electrical networks with network analyzers, including the types of measuremetns and how they allow you to characterize both linear and nonlinear behavior of your devices.

Application Note 2004-09-15

PDF PDF 5.82 MB
New Features in Version 5.0 Software for 3070 
Typically, when Agilent's Manufacturing Test Division introduces a new software revision for its flagship 3070 In-Circuit Tester, it only communicates with customers about the major new features.

Application Note 2003-01-28

PDF PDF 84 KB
New Techniques for Analyzing Phase Lock Loops (AN 164-3) 
This Application Note is for information only. Agilent no longer sells or supports these products.

Application Note 1975-06-01

PDF PDF 795 KB
Next-generation Test Systems: Advancing the Vision with LXI (AN 1465-16) 

Application Note 2006-05-01

PDF PDF 263 KB
Non-Volatile Memory Programming on the Agilent 3070 
The trend in non-volatile memory, like the general trend in electronic products, is to increase capability, reduce size, reduce cost, and get the final product to market faster than the competition.

Application Note 2003-05-29

PDF PDF 28 KB
Obtaining a Listing of Applications on Series II Systems 
There is currently no easy way to obtain a list of all resident applications on a 5DX System or TDW. It is difficult to match panel name with hash name and see when the application was last updated.

Application Note 2002-06-01

 
Optical Spectrum Analysis Basics (AN 1550-4) 
This Application Note is intended to provide the reader with a basic understanding of optical spectrum analyzers, their technologies, specifications, and applications. Chapter 1 describes interferometer-based and diffraction- grating-based optical spectrum analyzers. Chapter 2 defines many of the...

Application Note 2000-09-01

PDF PDF 222 KB
Langues 
Optimizing Dynamic Range for Distortion Measurements 
This Product Note covers high dynamic range measurement techniques for the new PSA Performance Spectrum Analyzer Series. The Note describes the best way to use the PSA series to make distortion measurements such as ACP, intermodulation, and harmonic distortion.

Application Note 2011-10-27

PDF PDF
Paperless Calibration - White Paper 
Discusses the benefits of storing calibration records electronically rather than on paper in filing cabinets and explains why having a hard copy of these files is not necessary.

Application Note 2013-01-25

PDF PDF 1.97 MB
Photonics Connector Care: Effects of Damage Connectors and Interfaces in Fiber Optic Measurements 
To qualify or predict the effects of damaged fiber optic connectors or optical interfaces, a qualitative assessment can ensure that these connectors are kept in a condition of optimum performance.

Application Note 2012-10-14

PDF PDF 2.28 MB
PLD Programming on the Agilent 3070 Using the PLD ISP Product 
In-System Programmable PLDs are more widely used on today's boards to provide flexibility to design engineers and to reduce the cost of a product.

Application Note 2002-02-26

PDF PDF 242 KB
PLR and 5DX Customized Defect Names Implementation 
You can use customized defect names on both the 5DX and on the PLR. This is particularly valuable when you want to display defect names in a local language.

Application Note 2003-03-01

 
PNA - Amplifier - High-Power Testing (1408-10) 

Application Note 2005-09-28

PDF PDF 888 KB
Langues 
PNA - Amplifier Linear and Gain Compression Measurements (1408-7) 
Application note covering testing of an amplifier's linear S-parameters and gain compression using Agilent's microwave PNA Series of vector network analyzers.

Application Note 2006-08-08

PDF PDF 817 KB
Langues 
PNA - Amplifier Swept-Harmonic Measurements (1408-8) 
This application note cover testing an amplifiers harmonics, using (MW) PNA Series of vector network analyzers. Linear parameters, such as gain and return loss are covered in Application Note 1408-7.

Application Note 2006-08-14

PDF PDF 1.23 MB
Langues 
PNA - Amplifier-CW and Swept IMD Measurements (1408-9) 
This application note covers testing an amplifier's intermodulation-distortion products, using (MW) PNA Series of vector network analyzers.

Application Note 2006-08-08

PDF PDF 2.78 MB
Langues 
PNA - Analyze Lightwave Components (1408-14) 

Application Note 2005-06-30

PDF PDF 471 KB
PNA - Banded Millimeter-Wave Measurements (AN 1408-15) 
Contains banded millimeter-wave system configurations, system operation, system calibration, and typical measurement examples.

Application Note 2009-11-24

PDF PDF 1.95 MB
Langues 

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