Basics & Measurement Fundamentals
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Spectrum Analysis Basics: From 1998 Back to Basics Seminar
In this paper learn why spectrum analysis is important for a variety of applications and learn how to measure system and device performance using a spectrum analyzer.
Training Materials 2001-04-18 |
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Network Analyzer Basics: From 1998 Back to Basics Seminar
This article covers the principles of measuring high-frequency electrical networks with network analyzers, including what kind of measurements are made with network analyzers
Training Materials 2001-04-16 |
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RF & Microwave Measurement Fundamentals
This 4-day class studies the principles of microwaves on transmission lines and power measurements, signal sources, mixers and modulation techniques, and the use of signal types in test applications.
Classroom Training |
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Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast
Original broadcast May 7, 2013
Webcast - recorded |
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Learn to Analyze, Validate and Debug High Speed DDR3 Memory
Original broadcast Oct 4, 2011
Webcast - recorded |
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USB 3.0 Physical Layer Test Challenges: Gen3 and Beyond Webcast
Original broadcast June 13, 2013
Webcast - recorded |
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RF and Microwave Education Series
2013 Webcast Series
Webcast - recorded |
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Wireless LAN Technology Fundamentals
Learn the applications, standards, and implementation of Wireless LAN. Includes IEEE 802.11a and b, physical and MAC layers, and interoperability issues.
Classroom Training |
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3070 Family WIN System Administration
Learn to successfully perform the tasks required of an Agilent 3070 Windows 2000 System Administrator. Understand the file system concepts and start-up/shutdown procedures. Discover the tools available to the system administrator.
Classroom Training |
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Signal Analyzer Fundamentals and New Applications Webcast
Original broadcast March 13, 2013
Webcast - recorded |
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Setting Up IC-CAP WaferPro For On-Wafer Measurements
originally broadcast June 22, 2011
Webcast - recorded |
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3070 Family Test Development Process
Learn to develop a board test program with the Agilent 3070 Family board test system.
Classroom Training |
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New Benchtop SMUs with Color GUI Meet Difficult Component Test Challenges Webcast
Originally broadcast June 16, 2011
Webcast - recorded |
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3070 Boundary Scan
Learn concepts of Boundary-Scan technology. TAP (test access port), the functionality of registers (BYPASS, boundary, IDCODE), and the structure of the "boundary-cell" are described.
Classroom Training |
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i5000 Sustaining Engineer
Classroom Training |
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Innovations in EDA: High Performance Digital Pre-Distortion (DPD) for Wideband Systems
Original broadcast Sept 1, 2011
Webcast - recorded |
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Troubleshooting Digital Designs with a Logic Analyzer Webcast
Originally broadcast April 28, 2011
Webcast - recorded |
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Today’s Power Supplies: Meeting Basic and Sophisticated Application Requirements
Originally broadcast June 29, 2011
Webcast - recorded |
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New impedance measurement solutions & apps using 5 Hz to 3 GHz VNA
Originally broadcast April 19, 2011
Webcast - recorded |
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Parametric Test Basic Training Part 2
Originally broadcast Jan 19, 2011
Webcast - recorded |
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Analyze Agile or Elusive Signals Using Real-time Measurement and Triggering Webcast
Original broadcast April 24, 2013
Webcast - recorded |
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PXI, AXIe, DAQ and Modular Solutions Webcast Series
Live and on-demand webcasts, various dates in 2012
Webcast |
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RF & Microwave Fundamentals Curriculum
An eight course curriculum that gives technicians basic understanding of Radio Frequency (RF) and Microwave (MW) measurements. Topics include the basics of connecting to power sources to frequency measurements. Offered at NHCTC.
Classroom Training |
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Beyond CMOS vs. GaAs – Finding the Best Technology Mix for a Handset PA Webcast
Live broadcast June 13, 2013; 7am Pacific and 10am Pacific
Webcast - recorded |
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In-circuit Test - Archived Event and Seminar Material
Webcast - recorded |
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