基础
去除所有优化26-50 / 271
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安捷伦成功测量阻抗的 8 点提示 应用指南 346-4
安捷伦成功测量阻抗的 8 点提示 应用指南 346-4
应用说明 2011-12-31 |
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Calibration of a Ratio Transformer - White Paper
Describes a calibration technique for decade ratio transformers which is performed by comparison measurement at 1kHz.
应用说明 2011-11-16 |
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2.30 MB
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Optimizing Dynamic Range for Distortion Measurements
This Product Note covers high dynamic range measurement techniques for the new PSA Performance Spectrum Analyzer Series. The Note describes the best way to use the PSA series to make distortion measurements such as ACP, intermodulation, and harmonic distortion.
应用说明 2011-10-27 |
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对校准实验室中的设备进行翻新的商业考虑因素，作者 Richard Ogg
全球内的校准实验室时刻都在发生变化，而这远低于所需校准的产品的变化速度。
应用说明 2011-10-05 |
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Isolating Frequency Measurement Error and Sourcing Frequency by Robert Leiby
When performing a calibration, the risk of incorrectly declaring a device as in-tolerance (false-accept risk) is dependent upon several factors such as the specified tolerance limit and guard band.
应用说明 2011-10-05 |
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3.42 MB
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Calibration Process Innovation Using Non-Required Guard Banded Testing by Richard Ogg
Calibration services vary as to how to set the acceptance limits compared to the required tolerance. Using a guard band to reduce the acceptance limit will increase the confidence in the calibration.
应用说明 2011-09-30 |
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582 KB
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Uncertainty Analysis for Uncorrelated Input Quantities by Alberto Campillo
Reference information for those who develop their own measurement uncertainties
应用说明 2011-08-01 |
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163 KB
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射频和微波功率测量的基本原理（第 3 部分）（AN 1449-3）
Power Measurement Uncertainty per International Guides
AN 1449-3, literature number 5988-9215EN
应用说明 2011-04-05 |
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Specifying Calibration Standards and Kits for Agilent Vector Network Analyzers (AN 1287-11)
This paper discusses calibration standard definitions, calibration kit content, and its structure requirements for Agilent's vector network analyzers. Also provided are set up examples and how to modify an existing calibration kit definition file.
应用说明 2011-03-28 |
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3.79 MB
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设置和使用技术指标――概述，作者 Michael Dobbert
设置技术指标并描述计量学家如何在校准中使用技术指标的技术。
应用说明 2010-09-01 |
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Fundamentals of RF and Microwave Noise Figure (AN 57-1)
This 32-page, black-and-white application note providesinformation on RF and Microwave noise figure measurementts. Topics include noise figure and temperature, noise characteristics of two-port networks, and the measurement of noise figure.
应用说明 2010-08-05 |
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Improved Throughput in Network Analyzer Applications (AN 1287-5)
This Application Note explores a variety of throughput issues and how they might affect different applications. It suggests ways to
improve network analyzer performance for better throughput in specific situations, and how to get an accurate picture of how an analyzer's performance might impact...
应用说明 2010-03-15 |
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Pragmatic Method for Pass/Fail Conformance Reporting that Complies by Michael Dobbert & Robert Stern
Innovative approach to simultaneously meet (ISO 17025, ILAC-G8, Z540.3)
应用说明 2010-03-01 |
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350 KB
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PNA - Banded Millimeter-Wave Measurements (AN 1408-15)
Contains banded millimeter-wave system configurations, system operation, system calibration, and typical measurement examples.
应用说明 2009-11-24 |
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1.95 MB
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Test and Measurement Instrument Security
This document describes security features and the steps to perform a security erase for select Agilent test and measurement instruments.
应用说明 2009-04-14 |
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167 KB
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Enhanced Log Records for the Agilent Medalist In-Circuit Test System
Track changes made to your i3070 test programs to improve success.
应用说明 2009-03-04 |
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801 KB
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Diagnostic Testing and the Medalist 5DX Automated X-ray Inspection System
Users of the Medalist 5DX automated x-ray inspection system can benefit from running diagnostic tests on a regular basis. This application note provides some guidelines.
应用说明 2009-01-14 |
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188 KB
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提高 PLL 设计效率--从自动运行的 VCO 表征到闭环 PLL 测量
This application note describes introduces practical solutions for VCO/PLL performance evaluation and gives actual examples of parameter measurements using the E5052B.
应用说明 2008-11-24 |
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IEEE 1149.6 Standard Boundary Scan Testing on Agilent Medalist i3070 ICT Systems
This paper introduces the latest advancements in Boundary Scan test capabilities on the Agilent Medalist i3070 In-Circuit Test platform that supports the testing of IEEE 1149.6-compliant devices.
应用说明 2008-11-24 |
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297 KB
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Achieving Fast Design Cycle Time
This application note describes how fast cycle time is achieved using the impedance analyzer such as the E4991A and 4294A with the Electronic Design Automation (EDA) tools.
应用说明 2008-11-13 |
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Agilent Medalist i3070测试程序最优化
应用说明 2008-11-01 |
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Exposed Pad Algorithm for the Medalist x6000 AXI System
This application note describes how to use the exposed pad algorithm in the Medalist x6000 AXI software to test all varieties of QFN and FET package types for defects such as Open and Voiding.
应用说明 2008-10-21 |
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1.83 MB
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构建混合测试系统，确保在两个公共开发情景中取得成功
应用说明 2008-10-15 |
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Setting Up HotKeys for AXI products on the Agilent Medalist Repair Tool
Users of the Agilent Medalist Repair Tool, also known as the Agilent Repair Tool (ART), can setup hot keys to increase the efficiency of image viewing in RT4.0 for their X-ray inspection products.
应用说明 2008-09-26 |
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629 KB
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First pass Yield (FPY) and Alarm Triggers on the Agilent Medalist i3070 In-circuit Test System
This application note will explain some customizations and how to create alarm triggers.
应用说明 2008-09-26 |
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131 KB
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