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- アプリケーション・ノート (283)
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製品カテゴリ
101-125 / 283
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Agilent 3070 Outsource Series Pay-Per-Use Board Test System
With an Agilent 3070 Outsource Pay-Per-Use System, you can define your system according to the products you have to test.
アプリケーション・ノート 2002-03-08 |
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Agilent TestJet Technology White Paper
This paper describes the Agilent TestJet technique, which makes use of a property of most digital ICs in use in the mid-1990s: the lead frame.
アプリケーション・ノート 2000-01-01 |
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An Internet-Enabled Primary Impedance Measurement System - White Paper
iPIMMS allows microwave network analyser users to achieve uncertainties which are equivalent to those of measurementsperformed at the National Physical Laboratory (NPI).
アプリケーション・ノート 2012-09-26 |
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AOI - A Strategy for Closing the Loop
This paper describes a set of defect prevention solutions centered on the availability of high-quality inspection and measurements data from an AOI system and a few carefully engineered software applications
アプリケーション・ノート 2006-04-16 |
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Applications and Operations of the 8970A Noise Figure Meter (PN8970A-1)
Part Number: 08970-99000 (Nov81). The 8970A is a discontinued product; this product note is provided for information only.
アプリケーション・ノート 1981-11-01 |
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Attenuation Measurement of Step Attenuators
Describes the T-matrix measurement method for achieving high accuracy in calibrating step attenuators.
アプリケーション・ノート 2012-10-02 |
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AXI and Lead-Free Process Characterization
How to use Automated X-ray Inspection as a tool to characterize new lead-free soldering processes.
アプリケーション・ノート 2005-06-21 |
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Best of 8 Hints for Making Better Oscilloscopes Measurements
Agilent engineers sharing ideas of how to use the equipment they design
アプリケーション・ノート 2008-03-17 |
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Boosting PLL Design Efficiency From free-running VCO characterizations to closed-loop PLL evaluation
This application note describes introduces practical solutions for VCO/PLL performance evaluation and gives actual examples of parameter measurements using the E5052B.
アプリケーション・ノート 2008-11-21 |
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Boundary Scan Ground Bounce Suppression
Boundary-Scan circuitry, while in the process of testing interconnections, can set up and excite current surges on a board. This in turn can cause "ground bounce".
アプリケーション・ノート 1998-04-24 |
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Boundary Scan Helps EMS Companies Cut Test Costs and Increase Revenues
Electronics Manufacturing Services (EMS) providers can utilize boundary-scan to reduce test cost expenses and also generate additional revenue opportunities.
アプリケーション・ノート 2003-03-01 |
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Boundary-Scan Technology, Justification, and Test Implementation for Designers
This paper provides practical insight for designers on the merits, design, and test implementation of Boundary-Scan Technology.
アプリケーション・ノート 1998-05-27 |
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Build Operator Menu: Multiple Menu Configuration Control for 5DX Auto User Interface
The "Build Operator Menu" software replaces and extends the functionality found in the BLDOPMNU DOS command. This application note provides useful user information about this menu.
アプリケーション・ノート 2008-09-04 |
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Business Considerations of Equipment Refresh in a Calibration Laboratory by Richard Ogg
Calibration laboratories operate in a world of constant change, and this is never more evident than in the products that are requested to be calibrated.
アプリケーション・ノート 2011-10-05 |
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Calibration of a Ratio Transformer - White Paper
Describes a calibration technique for decade ratio transformers which is performed by comparison measurement at 1kHz.
アプリケーション・ノート 2011-11-16 |
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Calibration of Precision Step Attenuators - White Paper
Automated parallel IF substitution system for precision attenuator calibration which has been in use for over 15 years and presents results of tests made on some very accurate attenuators.
アプリケーション・ノート 2012-10-14 |
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Calibration of Time Base Oscillators - White Paper
As more accurate clocks were produced, new uses of time measurement were explored. As new uses were discovered, the need for even more accurate clocks became apparent.
アプリケーション・ノート 2012-12-21 |
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Calibration Process Innovation Using Non-Required Guard Banded Testing by Richard Ogg
Calibration services vary as to how to set the acceptance limits compared to the required tolerance. Using a guard band to reduce the acceptance limit will increase the confidence in the calibration.
アプリケーション・ノート 2011-09-30 |
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CDPD MDBS Cell Site Test Software Troubleshooting
This Product Note is a troubleshooting guide designed to answer the most problematic and typical questions that occur when testing a CDPD MDBS with the Agilent Technologies 8921A CDPD test solution.
General situations
Data collection does not work
A parameter you changed does not...
アプリケーション・ノート 1997-06-01 |
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Cellular Call Processing: Programming Techniques for the Agilent (AN 8920A)
This Application Note specifically describes the programming format for AMPS cellular, however the techniques are similar for systems like NAMPS and TACS. The programming techniques used for the Agilent Technologies 8920A firmware have built-in cellular call processing functions. These techniques...
アプリケーション・ノート 1995-10-01 |
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Comparing AOI and AXI
Choosing the right technology requires looking at board mix, capital budget and other business considerations. But most of all, you need to understand the typical characteristics of each technology.
アプリケーション・ノート 2001-07-25 |
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Comparing CAD and BOM data for 5DX Use
Instructions for comparing CAD and BOM data to quickly deal with no load components.
アプリケーション・ノート 2008-01-04 |
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Comparing the Accuracy and Repeatability of On-Wafer CalibrationTechniques to 110 GHz
by Cascade Microtech
アプリケーション・ノート 2000-03-16 |
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Comparison of Different Jitter Analysis Techniques With a Precision Transmitter
This white paper describes how various jitter analysis techniques give dissimilar results. Which is right? We built a precision jitter transmitter to compare results of different techniques where test sets were exposed to known levels of jitter.
アプリケーション・ノート 2006-04-06 |
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Connecting a UPS to a 3070 Controller
This paper describes how to connect a UPS to the 3070 testhead controller. It uses the Advanced Power Conversion Smart-UPS with PowerChute Plus software.
アプリケーション・ノート 2003-01-07 |
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