Sprechen Sie mit einem Experten
Basics & Measurement Fundamentals
Refine the List
Alle detailierte Suchkriterien entfernen
Nach Applikation
- Metrology (29)
- Instrument Security (2)
- Fundamentals (168)
- Instrument OS & Software (65)
By Type of Content
- Document Library
- Application Notes
- Application Note (271)
- Application Notes
Nach Produkt Kategorie
26-50 of 271
|
Adjusting the Defect Analyzer detection parameters on the Medalist 5DX Automated X-ray System
Defect Analyzer operates by making a small change in the ‘z’ height of the board and re-testing suspect joints.
Application Note 2008-06-12 |
|
|
Adjusting the X-ray Surface Map parameters on the Medalist 5DX Automated X-ray System
Tips on obtaining the best images using the 5DX surface map parameters.
Application Note 2008-06-19 |
|
|
Advanced impedance measurement capability of the RF I-V method (AN 1369-2)
This application note describes the difference between the network analyzer and impedance analyzer for the measurement principle and actual measurement performance.
Application Note 2001-07-26 |
PDF
753 KB
|
|
Advanced TDR Techniques (AN 62-3)
This Application Note is for information only. Agilent no longer sells or supports these products.
Application Note 1990-04-01 |
PDF
2.73 MB
|
|
Agilent 3070 Now Powered by Industrial PC Controllers
The Agilent 3070 is now controlled by PCs similar to others used in your production and office environment lowering system administration and learning costs.
Application Note 2003-01-23 |
PDF
207 KB
|
|
Agilent 3070 Outsource Series Pay-Per-Use Board Test System
With an Agilent 3070 Outsource Pay-Per-Use System, you can define your system according to the products you have to test.
Application Note 2002-03-08 |
PDF
247 KB
|
|
Agilent TestJet Technology White Paper
This paper describes the Agilent TestJet technique, which makes use of a property of most digital ICs in use in the mid-1990s: the lead frame.
Application Note 2000-01-01 |
|
|
An Internet-Enabled Primary Impedance Measurement System - White Paper
iPIMMS allows microwave network analyser users to achieve uncertainties which are equivalent to those of measurementsperformed at the National Physical Laboratory (NPI).
Application Note 2012-09-26 |
PDF
440 KB
|
|
An Introduction to Multiport and Balanced Device Measurements (AN 1373-1)
The increase in integration in the wireless communications and electronics industries and the need to decrease size, cost, weight, and power consumption is driving design engineers to replace discrete components with more complex modules.
Application Note 2002-11-11 |
PDF
522 KB
|
|
AOI - A Strategy for Closing the Loop
This paper describes a set of defect prevention solutions centered on the availability of high-quality inspection and measurements data from an AOI system and a few carefully engineered software applications
Application Note 2006-04-16 |
PDF
291 KB
|
|
Applications and Operations of the 8970A Noise Figure Meter (PN8970A-1)
Part Number: 08970-99000 (Nov81). The 8970A is a discontinued product; this product note is provided for information only.
Application Note 1981-11-01 |
PDF
7.65 MB
|
|
Applying a New In-Circuit Probing Technique for High-Speed/High Density Printed Circuit Boards
Bead probes were used to obtain additional test access on a high-density production printed circuit board. This case study includes practical information and key bead-specific learnings discovered during the process of outsourcing.
Application Note 2006-10-24 |
PDF
723 KB
|
|
Attenuation Measurement of Step Attenuators
Describes the T-matrix measurement method for achieving high accuracy in calibrating step attenuators.
Application Note 2012-10-02 |
PDF
440 KB
|
|
AXI and Lead-Free Process Characterization
How to use Automated X-ray Inspection as a tool to characterize new lead-free soldering processes.
Application Note 2005-06-21 |
|
|
Best of 8 Hints for Making Better Oscilloscopes Measurements
Agilent engineers sharing ideas of how to use the equipment they design
Application Note 2008-03-17 |
PDF
320 KB
|
|
Bluetooth® RF Measurement Fundamentals (AN 1333-1)
Bluetooth® is an open specification for a wireless personal area network. It provides limited range RF connectivity for voice and data transmissions between information appliances.
Application Note 2006-10-12 |
|
|
Boosting PLL Design Efficiency From free-running VCO characterizations to closed-loop PLL evaluation
This application note describes introduces practical solutions for VCO/PLL performance evaluation and gives actual examples of parameter measurements using the E5052B.
Application Note 2008-11-21 |
PDF
2.91 MB
|
|
Boundary Scan Ground Bounce Suppression
Boundary-Scan circuitry, while in the process of testing interconnections, can set up and excite current surges on a board. This in turn can cause "ground bounce".
Application Note 1998-04-24 |
PDF
14 KB
|
|
Boundary Scan Helps EMS Companies Cut Test Costs and Increase Revenues
Electronics Manufacturing Services (EMS) providers can utilize boundary-scan to reduce test cost expenses and also generate additional revenue opportunities.
Application Note 2003-03-01 |
PDF
242 KB
|
|
Boundary-Scan Technology, Justification, and Test Implementation for Designers
This paper provides practical insight for designers on the merits, design, and test implementation of Boundary-Scan Technology.
Application Note 1998-05-27 |
PDF
29 KB
|
|
Build Operator Menu: Multiple Menu Configuration Control for 5DX Auto User Interface
The "Build Operator Menu" software replaces and extends the functionality found in the BLDOPMNU DOS command. This application note provides useful user information about this menu.
Application Note 2008-09-04 |
PDF
849 KB
|
|
Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance
Application Note 2008-10-15 |
|
|
Business Considerations of Equipment Refresh in a Calibration Laboratory by Richard Ogg
Calibration laboratories operate in a world of constant change, and this is never more evident than in the products that are requested to be calibrated.
Application Note 2011-10-05 |
|
|
Calibration of a Ratio Transformer - White Paper
Describes a calibration technique for decade ratio transformers which is performed by comparison measurement at 1kHz.
Application Note 2011-11-16 |
PDF
2.30 MB
|
|
Calibration of Precision Step Attenuators - White Paper
Automated parallel IF substitution system for precision attenuator calibration which has been in use for over 15 years and presents results of tests made on some very accurate attenuators.
Application Note 2012-10-14 |
PDF
1.38 MB
|
Enroll in myAgilent
Register Your Product
Why Buy Agilent