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Basics & Measurement Fundamentals

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3070 Boundary Scan 
Learn concepts of Boundary-Scan technology. TAP (test access port), the functionality of registers (BYPASS, boundary, IDCODE), and the structure of the "boundary-cell" are described.

Classroom Training

 
Agilent eventos en España 
Bienvenido a la página de eventos organizados por Agilent en España.

Seminar

 
Advanced Product Design & Test for High-Speed Digital Devices Webcast 
Original broadcast Jan 18, 2012

Webcast - recorded

 
Analyze Agile or Elusive Signals Using Real-time Measurement and Triggering Webcast 
Original broadcast April 24, 2013

Webcast - recorded

 
Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro 
Originally broadcast Jan 27, 2011

Webcast - recorded

 
Back to Basics Part 2: Signal Generation 
Original broadcast Feb 29, 2012

Webcast - recorded

 
Beyond CMOS vs. GaAs – Finding the Best Technology Mix for a Handset PA Webcast 
Original broadcast June 13, 2013

Webcast - recorded

 
Bluetooth Technology Fundamentals 
This 1-day course covers the applications for this new technology, the structure of the Bluetooth system architecture and the setup of so called short-range ad hoc networks will be introduced.

Classroom Training

 
Characterize and Correct for Cable, Switch and Test Fixture Loss Using Only a High-Bandwidth Scope 
Originally broadcast July 27, 2011

Webcast - recorded

 
Digitizer Design Fundamentals for Superior Measurements 
Original broadcast Mar 21, 2012

Webcast - recorded

 
Digitizing Oscilloscope Fundamentals 
This class gives the student an in-depth understanding of the operation and measurement techniques with an Infiniium oscilloscope.

Classroom Training

 
Driving Down Test Cost, Schedule & Risk with Smart Switching Webcast 
Original broadcast May 30, 2012

Webcast - recorded

 
Ethernet Compliance Testing: Become More Green and Energy Efficient Webcast 
Original broadcast March 20, 2013

Webcast - recorded

 
Fundamentals of CDMA 
This 2-day course covers the CDMA technology - its advantages and limitations.

Classroom Training

 
In-circuit Test - Archived Event and Seminar Material 

Webcast - recorded

 
Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs) 
Original broadcast Feb 2, 2012

Webcast - recorded

 
Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast 
Original broadcast May 7, 2013

Webcast - recorded

 
Innovations in EDA: Accelerating Radar/EW System Design using Wideband Virtual Scenarios Webcast 
Original broadcast April 4, 2013

Webcast - recorded

 
Innovations in EDA: High Performance Digital Pre-Distortion (DPD) for Wideband Systems 
Original broadcast Sept 1, 2011

Webcast - recorded

 
Interference Analysis Using Handheld Spectrum Analyzers Webcast 
Original broadcast Sept 21, 2011

Webcast - recorded

 
Learn to Analyze, Validate and Debug High Speed DDR3 Memory 
Original broadcast Oct 4, 2011

Webcast - recorded

 
Logic Analysis Fundamentals for Computer Solutions 
Learn how to configure and use the 16700 series of logic analysis tools to design and debug digital systems in this logic analysis fundamentals course.

Classroom Training

 
Medalist 3070 - Archived Event and Seminar Material 

Webcast - recorded

 
Medalist i5000 - Archived Event and Seminar Material 

Webcast - recorded

 
Metrology Events 
Attending events that focus on metrology let you network and learn at the same time.

Tradeshow

 

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