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PLD Programming on the Agilent 3070 Using the PLD ISP Product 
In-System Programmable PLDs are more widely used on today's boards to provide flexibility to design engineers and to reduce the cost of a product.

Application Note 2002-02-26

PDF PDF 242 KB
PLR and 5DX Customized Defect Names Implementation 
You can use customized defect names on both the 5DX and on the PLR. This is particularly valuable when you want to display defect names in a local language.

Application Note 2003-03-01

 
Preparing a .cc File for Export to Test Link 
This procedure describes the process of converting ECAD data into a form that can be used by Test Link.

Application Note 2002-10-16

PDF PDF 70 KB
Printed Circuit Board Split-Pad Test Method and Design 
This application note describes the split-pad concept for use with a bed of nails style test fixture.

Application Note 1999-06-01

PDF PDF 50 KB
Product Comparison: the E8285A CDMA Mobile Station Test Set versus the 8924C CDMA Mobile Station... 
The Agilent 8924C Option 601 CDMA Mobile Station Test Set and E8285A CDMA MS Service Test Set act as calibrated, high performance base stations to provide the essential set of measurements required to test the parametric and functional characteristics of dual-band, dual-mode CDMA phones. This...

Application Note 2000-04-01

PDF PDF 727 KB
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Pumping Station Control 
In this Application Note following the description of the pumping station control application, measurement and control requirements for characterizing the process are discussed. Then, Agilent VXI-based data acquisition equipment suitable for such an application is listed. Description...

Application Note 1997-11-01

PDF PDF 110 KB
Realizing the Benefits of 3D Inline Solder Paste Inspection 
Published in SMT Magazine/Germany, August 2003

Application Note 2003-08-01

PDF PDF 67 KB
Reducing Load Time for Loaderless Systems 
For Series 2L systems, it may be possible to reduce the time it takes to load a panel.

Application Note 1999-12-01

 
Reducing Process Defect Escapes with Vectorless Test 
Process defects that escape in-circuit test lead at best to increased repair costs, and at worst to a "bone pile1" problem.

Application Note 2001-05-17

PDF PDF 512 KB
Remote Network Connections Creation for the Operator Logon 
Operator logon on the Agilent 5DX Series II System is limited, in that it does not allow Operator to make network connections that are required for sending images and res files to the PLR workstation.

Application Note 2002-06-30

 
Rolling Mill 
In this Application Note following the description of the rolling mill application, measurement and control requirements for characterizing the process are discussed. Then, Agilent VXI-based data acquisition suitable for such an application is listed. Description Steel, aluminum, fiberglass...

Application Note 1997-11-01

PDF PDF 82 KB
Rotating Boards on a Panel 
Rotating Boards on a Panel if often necessary. In addition to the software revisions named within, the explained technique in the document is utilized for for 4.x, 5.x, 6.x and 7.x. For 8.x Test Link deals with this automatically.

Application Note 2001-05-17

PDF PDF 40 KB
Sampling on the Agilent 5DX 
Sampling Mode allows test coverage to be optimized with line speed. This document explore the setup procedure for the Agilent 5DX for sampling.

Application Note 2002-05-08

 
Series II Compliance with the Machinery Directive (in Europe) - specific installation procedures 
Series II will meet requirements of Machinery Directive in European Community member countries, if the following steps, which are described in the document, are taken during installation of equipment.

Application Note 2001-05-17

 
Solder Paste Inspection - Organize the Pieces 
Published in Global SMT & Packaging, November 2003

Application Note 2003-11-01

PDF PDF 818 KB
Solder Paste Inspection for the SMT line: 3D In-line Systems Come of Age 
Published in Electronic Production & Test, May 2003.

Application Note 2003-05-01

PDF PDF 115 KB
Standardized Core Makes Building and Supporting a Functional Test System Easier and Less Costly 
This note demonstrates how to use LXI instruments to create a standardized core - the open test platform (OTP), for building test systems.

Application Note 2007-02-23

PDF PDF 234 KB
Languages 
System Developer Guide Using LAN in Test Systems - PC Configuration (AN 1465-11) - Application Note 
Using LAN in Test Systems: PC Configuration,the third note in the series, describes the additional capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10.

Application Note 2004-10-19

PDF PDF 204 KB
System Issues in Boundary-Scan Board Test 
While Boundary-Scan is a powerful test tool, test engineers are finding out that yesterday's DFT rules and test approaches may actually be detrimental to successfully testing systems on a board.

Application Note 2003-01-28

PDF PDF 37 KB
Taking and Using Diagnostic Images 
Storing images can be a helpful method for trouble-shooting and collaboration with support. This document explains the methods for taking images. In addition to the software revisions named, the document applies to all 5DX software versions.

Application Note 2001-05-17

PDF PDF 61 KB
Test and Inspection as Part of the Lead-free Manufacturing Process 
The paper addresses issues that will impact defect levels and defect spectrum during the transition to lead-free manufacturing. It also addresses different test and inspection systems’ readiness to test lead-free printed circuit board assemblies.

Application Note 2005-02-22

PDF PDF 421 KB
Test Coverage: What Does It Mean when a Board Test Passes? 
Originally presented at the 2002 International Test Conference -- Characterizing board test coverage as a percentage of devices or nodes having tests does not accurately portray coverage, especially in a limited access testing environment.

Application Note 2003-07-28

PDF PDF 266 KB
Test-System Computer I/O Considerations (AN 1465-2) - Application Note 
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing

Application Note 2004-12-09

PDF PDF 189 KB
Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note 
This application note answers common questions about the use of drivers and direct I/O to send commands from a PC application to the test instrument.

Application Note 2004-12-21

PDF PDF 374 KB
Testing Transformers on Unpowered Systems 
This paper explains how to test basic analog parts, using unpowered systems.

Application Note 2003-03-21

PDF PDF 10 KB

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