Control & Automation of Instruments & Systems

What to Consider When Selecting the Optimal Test Strategy This paper addresses several issues for selecting the optimal inspection strategy, presenting data from many studies that Agilent has performed in the quest to find the optimal test / inspection strategy. Application Note 2003-03-01	PDF 175 KB
Windows & Unix Feature Comparison The Windows & Unix 3070 Feature Comparison document provides a detailed listing of features translated to the Windows based 3070 from the Unix based 3070. Application Note 2002-07-31	PDF 71 KB
Writing Flash Memory with Agilent 3070 Systems Flash memory is traditionally programmed on PROM programmers, but some manufacturers report a one percent damage rate due to the extra handling steps required! Application Note 2001-05-18	PDF 31 KB
X-ray Test Users Utilize BOM Explorer to Change Automated X-ray Inspection 5DX Users can save time by implementing these quick and easy steps to use BOM explorer to change "no pops" to "untested". Application Note 2007-10-12
“Shotgunning”, a Bad Fit for Lead-Free Test Shotgunning, a common repair technique in functional test, will be negatively affected by lead-free processes. This article explores the technique and draws broad conclusions regarding the impact of lead-free on electronics manufacturing test Application Note 2006-02-07	PDF 44 KB

Enroll in myAgilent
A personalized view into the information most relevant to you.
Register Your Product
Register your products for service notifications, firmware update alerts, application notes and more…
Why Buy Agilent
See how the Agilent Advantage adds value to your purchase.